Lighted probe for electrical testing device

A lighted probe for an electrical testing device, comprising:

• a hollow main body having a first end, a second end, and a handle portion arranged on an elongate axis, the handle portion disposed between the first end and the second end, the handle portion having a top section and a bottom section that are removably connected;
• a light source housing disposed on the first end of the hollow main body;
• a probe tip having a conductive end and a non-conductive end, the conductive end arranged on the elongate axis of the hollow main body, and the non-conductive end of the probe tip disposed on the light source housing at the first end of the hollow main body;
• an integrated light source disposed in the light source housing of the hollow main body, the integrated light source configured to direct light beams toward the conductive end of the probe tip, wherein the integrated light source includes a plurality of lights arranged around the probe tip, the plurality of lights are oriented in a cross-like configuration at the light source housing adjacent the non-conductive end of the tip, wherein the plurality of lights includes a first pair of lights and a second pair of lights, the first pair of lights disposed on a first axis and the second pair of lights disposed on a second axis, the first axis oriented orthogonal with the second axis;
• an electrical testing device wire disposed in the hollow main body and extending from the conductive end of the probe tip at the first end of the hollow main body, through nonconductive end of the probe tip and the hollow main body, and to the second end of the hollow main body, wherein the electrical testing device wire is configured to transfer one of a signal and data from the probe tip to the electrical testing device;
• a light power source including at least one battery removably disposed between the top section and the bottom section of the handle portion of the hollow main body in selective electrical communication with the integrated light source, the light power source being independent from a device power source connected to the electrical testing device wire;
• and
• a probe activation switch, wherein the probe activation switch is configured to selectively allow an electric current to travel from the conductive end of the probe tip through the electrical testing device wire and to the electrical testing device,
• wherein the electrical device wire includes a first section that is connected to a first circuit connector and a second section that is connected to a second circuit connector, the first circuit connector and the second circuit connector are selectively placed in electrical communication with one another when the top section and the bottom section of the handle portion are connected,
• wherein the probe tip is removably connected to the hollow main body and is interchangeable, the probe tip configured to be reversibly coupled to a surface for testing.

A lighted probe and electrical testing device combination, comprising:

• a lighted probe having a first end, a second end, and a handle portion arranged on an elongate axis, the handle portion disposed between the first end and the second end, the handle portion having a top section and a bottom section that are removably connected, a light source housing disposed on a first end of a hollow main body, a probe tip having a conductive end and a non-conductive end, the conductive end arranged on the elongate axis of the hollow main body, and the non-conductive end of the probe tip disposed on the light source housing at the first end of the hollow main body, and an integrated light source disposed in the light source housing of the hollow main body, the integrated light source configured to direct light beams toward the conductive end of the probe tip;
• an electrical testing device in wired communication with the lighted probe and receiving one of signals and data from the conductive end of the probe tip of the lighted probe;
• a probe activation switch, wherein the probe activation switch is configured to selectively allow an electric current to travel from the conductive end of the probe tip through an electrical testing device wire and to the electrical testing device;
• and
• a light power source including at least one battery removably disposed between the top section and the bottom section of the handle portion of the hollow main body;
• and
• wherein the electrical device wire includes a first section that is connected to a first circuit connector and a second section that is connected to a second circuit connector, the first circuit connector and the second circuit connector are selectively placed in electrical communication with one another when the top section and the bottom section of the handle portion are connected,
• wherein the probe tip is removably connected to the hollow main body and is interchangeable, the probe tip configured to be reversibly coupled to a surface for testing.