Method and system for obtaining information from a sample
AssigneeApplied Materials Israel Ltd.
InventorsBoris Golberg, Roman Naidis
Life of this patent
Estimating the term…
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AssigneeApplied Materials Israel Ltd.
InventorsBoris Golberg, Roman Naidis
Estimating the term…
A method and a system for obtaining information from a sample. The system may include (i) a spatial filter that includes a blocking element and an aperture; (ii) an illumination unit; and (iii) an optical unit that includes an optical objective assembly. The illumination unit may be configured to illuminate the optical objective assembly with oblique radiation. The optical objective assembly may be configured to (a) focus the oblique radiation onto the sample, (b) collect radiation from the sample to provide collected radiation, and (c) reflect the oblique radiation to provide back reflected radiation. The optical unit may be configured to (a) focus the collected radiation to provide focused collected radiation, (b) direct the focused collection radiation towards the aperture, (c) focus the back reflected radiation to provide focused back reflected radiation, and (d) direct the focused back reflected radiation towards the blocking element.
A system for obtaining information from a sample, the system comprises:
A method for obtaining information from a sample, the method comprises:
Dependencies are inferred from the claim text.