Sensor devices with test magnets, and associated methods
AssigneeInfineon Technologies AG
InventorDirk Hammerschmidt
Life of this patent
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Abstract
A sensor device comprises at least one test magnet which is designed to provide a magnetic test field, a first sensor element which is designed to capture a magnetic field and to provide a first sensor signal, wherein the first sensor signal comprises a first signal contribution on the basis of the magnetic test field, a second sensor element which is designed to capture a magnetic field and to provide a second sensor signal, wherein the second sensor signal comprises a second signal contribution on the basis of the magnetic test field, wherein the magnetic test field at the location of the first sensor element differs from the magnetic test field at the location of the second sensor element.
Claims20
A sensor device comprising:
- at least one test magnet configured to provide a magnetic test field,
- wherein the at least one test magnet comprises at least a first test magnet and a second test magnet;
- a first sensor element configured to capture a first magnetic field and to provide a first sensor signal, wherein the first sensor signal comprises a first signal contribution based on the magnetic test field;
- and
- a second sensor element configured to capture a second magnetic field and to provide a second sensor signal, wherein the second sensor signal comprises a second signal contribution based on the magnetic test field,
- wherein the magnetic test field at a location of the first sensor element differs from the magnetic test field at a location of the second sensor element, and
- wherein the first test magnet is arranged beside the first sensor element and the second test magnet is arranged beside the second sensor element.
A method comprising:
- providing a magnetic test field,
- wherein the magnetic test filed is provided by at least one test magnet comprising a first test magnet and a second test magnet;
- providing a first sensor signal by a first sensor element, wherein the first sensor signal comprises a first signal contribution based on the magnetic test field;
- and
- providing a second sensor signal by a second sensor element, wherein the second sensor signal comprises a second signal contribution based on the magnetic test field,
- wherein the magnetic test field at a location of the first sensor element differs from the magnetic test field at a location of the second sensor element, and
- wherein the first test magnet is arranged beside the first sensor element and the second test magnet is arranged beside the second sensor element.
Dependencies are inferred from the claim text.