Automatic analysis device
AssigneeHitachi High-Tech Corporation
InventorsShunsuke Sasaki, Takenori Okusa
Life of this patent
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AssigneeHitachi High-Tech Corporation
InventorsShunsuke Sasaki, Takenori Okusa
Estimating the term…
An automatic analysis device which can be accessed from a front surface of the device to a rear surface side of the device when a user accesses the automatic analysis device and reduce the risk of damage to a rod-shaped member due to contact. A reagent suction position, a reagent discharge position, a reagent dispensing nozzle cleaning portion, and a reagent dispensing mechanism retraction portion from which the reagent dispensing mechanism is retracted are disposed on a trajectory of an arm of the reagent dispensing mechanism. A nozzle guide accommodation portion accommodates a nozzle guide of a reagent dispensing mechanism and the reagent dispensing nozzle. The reagent dispensing mechanism retraction portion is a cylindrical member protruding downward from an upper surface cover of the automatic analysis device and prevents direct contact with the reagent dispensing nozzle by positioning the reagent dispensing nozzle in the nozzle accommodation portion.
An automatic analysis device comprising:
An automatic analysis device comprising:
Dependencies are inferred from the claim text.