# US 11,443,781 B2 · Semiconductor system and method of operating the same

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- Number: US 11,443,781 B2
- Document ID: US11443781B2
- Status: Granted
- Kind: B2
- Application number: 17/199,071
- Filed: 2021-03-11
- Published: 2021-07-01
- Granted: 2022-09-13
- Earliest claimed: 2018-11-05
- Assignees: SK hynix Inc.
- Applicants: SK hynix Inc.
- Inventors: Jun Yong Song
- Web page: https://patentgrep.com/patent/US11443781B2

## CPC

- G11C 7/1051: {Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits}
- G11C 7/1084: {Data input buffers, e.g. comprising level conversion circuits, circuits for adapting load}
- G11C 5/147: {Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops (G11C5/141 takes precedence)}
- G11C 7/1045: {Read-write mode select circuits}
- G11C 7/1048: {Data bus control circuits, e.g. precharging, presetting, equalising}
- G11C 7/1078: {Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits}
- G11C 29/38: Response verification devices
- G11C 29/50: Marginal testing, e.g. race, voltage or current testing
- G11C: STATIC STORES (semiconductor memory devices H10B)

## Abstract

A semiconductor system may include a first semiconductor device and a second semiconductor device. The first semiconductor device compares a received signal with an original signal to generate a driving force control signal. The first semiconductor device also drives the original signal using a driving force in accordance with the driving force control signal to output an external transmission signal. The second semiconductor device receives the external transmission signal to generate a positive signal and a negative signal. The second semiconductor device also generates a restoration signal in response to the positive signal and the negative signal. The second semiconductor device additionally outputs the restoration signal as the external transmission signal to the first semiconductor device.

## Claims

### Claim 1

A method of operating a semiconductor system, the method comprising:
test-setting a first semiconductor device and a second semiconductor device based on a test signal;
driving an original signal by the first semiconductor device using an initial driving force;
transmitting the driven original signal as an external transmission signal to the second semiconductor device;
generating a restoration signal based on the external transmission signal transmitted to the second semiconductor device;
transmitting the restoration signal as the external transmission signal to the first semiconductor device;
comparing the original signal with the external transmission signal transmitted from the second semiconductor device to the first semiconductor device;
changing the initial driving force;
driving the original signal by the first semiconductor device using the changed driving force; and
transmitting the driven original signal as the external transmission signal to the second semiconductor device.

### Claim 2 (depends on 1)

The method of claim 1, wherein generating a restoration signal based on the external transmission signal transmitted to the second semiconductor device comprises:
generating a positive signal and a negative signal in response to the external transmission signal;
decreasing a voltage of any one of the positive signal and the negative signal by a set voltage level; and
generating the restoration signal based on the positive signal and the negative signal, wherein one of the positive signal and the negative signal has the decreased voltage.

### Claim 3 (depends on 1)

The method of claim 1, wherein comparing the original signal with the external transmission signal transmitted from the second semiconductor device to the first semiconductor device and changing the initial driving force comprises:
comparing the original signal with the external transmission signal transmitted from the second semiconductor device to the first semiconductor device to generate a first comparison detection signal;
comparing the first comparison detection signal with a reference signal to generate a second comparison detection signal; and
changing the initial driving force based on the second comparison detection signal.
