# US 11,442,099 B2 · Testing device and testing method for performing an electrical stress test and a power-on test on an array substrate of a dispaly panel > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 11,442,099 B2 - Document ID: US11442099B2 - Status: Granted - Kind: B2 - Application number: 16/327,317 - Filed: 2018-11-01 - Published: 2021-10-21 - Granted: 2022-09-13 - Earliest claimed: 2018-10-16 - Assignees: Hkc Corporation Limited - Applicants: Hkc Corporation Limited - Inventors: Bei Zhou Huang - Web page: https://patentgrep.com/patent/US11442099B2 ## CPC - G02F 1/1303: {Apparatus specially adapted to the manufacture of LCDs} - G01R 31/2831: {Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates (G01R31/318511 takes precedence; testing during manufacture H10P74/00)} - G01R 31/2844: {using test interfaces, e.g. adapters, test boxes, switches, PIN drivers (G01R31/2889 takes precedence)} - H10K 71/70: Testing, e.g. accelerated lifetime tests - G02F 1/136254: {Checking; Testing} - G02F 2203/69: Arrangements or methods for testing or calibrating a device - H10K 59/10: OLED displays - G02F: OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - H10K: ORGANIC ELECTRIC SOLID-STATE DEVICES ## Abstract The present application discloses a testing device of array substrates and a testing method. The testing device of array substrates includes: a machine and testing interfaces, the testing interfaces being disposed on the machine; and testers disposed above the machine. There are at least two sets of testers, and the testers synchronously operate according to a preset scheme. ## Claims ### Claim 1 A testing device for testing array substrates for a display panel, comprising: a worktable, configured to place a plurality of array substrates to be tested; testing interfaces disposed on the worktable and corresponding to each of the array substrates; and testers disposed on the worktable and matched with the testing interfaces to carry out an electrical stress test and a power-on test on the array substrates; there are at least two testers, and the testers synchronously operate according to a preset scheme, wherein the at least two testers are all disposed above the plurality of array substrates for performing the electrical stress test and the power-on test on the array substrates; wherein the testers comprise a first tester and a second tester; the first tester is located in front of the second tester in a testing direction by a distance of at least one row of one or more array substrates; and the preset scheme comprises: the first tester carries out the electrical stress test on the plurality of array substrates successively on a one-row-by-one-row basis, and the second tester carries out the power-on test on each row of the plurality of array substrates that has finished the electrical stress test performed by the first tester; wherein the plurality of array substrates are mounted on the worktable in aligned rows and columns, and each row comprises at least one aligned array substrate, wherein the first tester and the second tester are each disposed in parallel with a row orientation of the array substrates, wherein initially the first tester is placed at one end of a second row at which the testing interfaces of the at least one aligned array substrate of the second row are disposed, and the second tester is placed at one end of a first row where the testing interfaces of the at least one aligned array substrate of the first row are disposed, and wherein since this time the first tester is configured to perform the electrical stress test on the at least one aligned array substrate of the second row simultaneously and then relatively move to the third row and perform the electrical stress test on the at least one array substrate of the third row simultaneously, and at same steps the second tester is configured to perform the power-on test on the at least one aligned array substrate of the first row simultaneously and then relatively move to the second row and perform the power-on test on the at least one aligned array substrate of the second row simultaneously which has finished the electrical stress test performed by the first tester, and wherein the above process is continued until the first tester reaches the last row and both the electrical stress test and the power-on test have been performed on each of the plurality of array substrates. ### Claim 2 (depends on 1) The testing device of array substrates according to claim 1, wherein each of the array substrates corresponds to two testing interfaces. ### Claim 3 (depends on 1) The testing device according to claim 1, wherein one and only one instance of the electrical stress test and one and only one instance of the power-on test are performed on each of the plurality of array substrates, and wherein for each of the plurality of array substrates the electrical stress test is performed before the power-on test. ### Claim 4 (depends on 1) The testing device according to claim 1, wherein a length of the tester is equal to or greater than a width of a testing region of the worktable; when starting operating, the second tester first carries out the electrical stress test and then carries out the power-on test on the at least one aligned array substrate of the first row, while synchronously the first tester is carrying out the electrical stress test on the at least one aligned array substrate of the second row; and then the second tester only carries out the power-on test on the testing interfaces that have been tested by the first tester, until both the electrical stress test and the power-on test have been performed on each of the plurality of array substrates. ### Claim 5 (depends on 1) The testing device according to claim 1, wherein the plurality of array substrates are arranged on the worktable in two columns and so each row comprises two aligned array substrates. ### Claim 6 A testing method for a testing device for testing array substrates for a display panel, the testing device comprising: a worktable, configured to place a plurality of array substrates to be tested; and testing interfaces disposed on the worktable and corresponding to each of the array substrates; the testing method comprises: placing at least two testers on a worktable; connecting the testers to testing interfaces; and synchronously operating the testers according to a preset scheme to carry out an electrical stress test and a power-on test on the array substrates; wherein the at least two testers are all disposed above the plurality of array substrates for performing the electrical stress test and the power-on test on the array substrates; wherein the testers comprise a first tester and a second tester; the first tester is located in front of the second tester in a testing direction by a distance of at least one row of one or more array substrates; and the preset scheme comprises: the first tester carries out the electrical stress test on the plurality of array substrates successively on a one-row-by-one-row basis, and the second tester carries out the power-on test on each row of the plurality of array substrates that has finished the electrical stress test performed by the first tester; wherein the plurality of array substrates are mounted on the worktable in aligned rows and columns, and each row comprises at least one aligned array substrate, wherein the first tester and the second tester are each disposed in parallel with a row orientation of the array substrates, wherein initially the first tester is placed at one end of a second row at which the testing interfaces of the at least one aligned array substrate of the second row are disposed, and the second tester is placed at one end of a first row where the testing interfaces of the at least one aligned array substrate of the first row are disposed, and wherein a length of the tester is equal to or greater than a width of a testing region of the worktable; when starting operating, the second tester first carries out the electrical stress test and then carries out the power-on test on the at least one aligned substrate of the first row, while the first tester is synchronously carrying out the electrical stress test on the at least one aligned array substrate of the second row; and then the second tester only carries out the power-on test on the testing interfaces that have been tested by the first tester, until both the electrical stress test and the power-on test have been performed on each of the plurality of array substrates.