# US 11,442,094 B2 · Polygonal spherical space sampling device > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 11,442,094 B2 - Document ID: US11442094B2 - Status: Granted - Kind: B2 - Application number: 17/335,098 - Filed: 2021-06-01 - Published: 2022-06-16 - Granted: 2022-09-13 - Earliest claimed: 2020-12-10 - Assignees: Shenzhen Xinyi Technology Co., Ltd. - Applicants: Shenzhen Xinyi Technology Co., Ltd. - Inventors: Linbin Chen; Zhenkun Xie; Daoyi Wang; Cien Sun; Kaixuan Jiang - Web page: https://patentgrep.com/patent/US11442094B2 ## CPC - G01R 29/10: Radiation diagrams of antennas - G01R 29/105: {using anechoic chambers; Chambers or open field sites used therefor (test sites used for measuring on other objects than aerials G01R29/0828; wave absorbing devices H01Q17/00)} - G01R 29/0871: {Complete apparatus or systems; circuits, e.g. receivers or amplifiers (G01R29/0878, G01R29/0892 take precedence; dosimeters, warning devices G01R29/0857)} - H05K 9/0009: {with provisions to reduce EMI leakage through the joining parts} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - H05K: PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS ## Abstract This application provides a polygonal spherical sampling device, belonging to the technical field of spherical field antenna measurement, and including a probe, a mounting rack and a supporting platform. The supporting platform is mounted on the mounting rack for placing an object to be tested. The number of the probes is more than or equal to six, the probes are mounted on the mounting rack and a plurality of the probes are distributed on at least two vertical planes in a three-dimensional spherical space and are arranged around the supporting platform. The vertical planes are arranged symmetrically about a vertical axis, the probes are uniformly distributed at intervals of A degrees on each vertical plane, the probes on a same horizontal plane are uniformly distributed at intervals of B degrees, both A and B are less than or equal to 90. ## Claims ### Claim 1 A polygonal spherical space sampling device, comprising a plurality of probes, a mounting rack and a supporting platform, wherein the supporting platform is mounted on the mounting rack for placing an object to be tested; a number of the plurality of probes is more than or equal to six, the plurality of probes are mounted on the mounting rack and the plurality of probes are distributed on at least two vertical planes in a three-dimensional spherical space and are arranged around the supporting platform; the at least two vertical planes are arranged symmetrically about a vertical axis, the plurality of probes are uniformly distributed at intervals of A degrees on each of the at least two vertical planes, the plurality of probes on a same horizontal plane are uniformly distributed at intervals of B degrees, both A and B are less than or equal to 90, centers at a top and a bottom of the mounting rack respectively share one of the plurality of probes, the number of the plurality of probes is N=360/B (180/A−1)+2, A and B are both positive numbers and 180 is divisible by each of A and B. ### Claim 2 (depends on 1) The polygonal spherical space sampling device according to claim 1, wherein the mounting rack comprises two mounting frames arranged perpendicular to one another and a base; the two mounting frames are both perpendicular to an upper surface of the base, the A is 45, the B is 90, the number of the plurality of probes is equal to fourteen, a junction joint at a top of the two mounting frames and a junction joint at a bottom of the two mounting frames respectively share one of the plurality of probes. ### Claim 3 (depends on 1) The polygonal spherical space sampling device according to claim 1, wherein the mounting rack comprises a base and three mounting frames arranged symmetrically around a vertical axis, the three mounting frames are perpendicular to an upper surface of the base, the A is 45, the B is 60, the number of the plurality of probes is equal to twenty, a junction joint at a top of the three mounting frames and a junction joint at a bottom of the three mounting frames respectively share one of the plurality of probes. ### Claim 4 (depends on 1) The polygonal spherical space sampling device according to claim 1, wherein the supporting platform comprises a connecting portion and a supporting plate, the supporting plate is fixed to the mounting rack through the connecting portion, and the supporting plate is provided with a weight reducing hole. ### Claim 5 (depends on 4) The polygonal spherical space sampling device according to claim 4, wherein the supporting plate is detachably mounted with test jigs with different heights, or the supporting plate is adjustably mounted on the connecting portion and has a height adjustment function. ### Claim 6 (depends on 1) The polygonal spherical space sampling device according to claim 1, wherein an outer surface of the mounting rack is wrapped with a wave absorbing foam, and the wave absorbing foam is provided with a plurality of through holes for mounting the plurality of probes. ### Claim 7 (depends on 6) The polygonal spherical space sampling device according to claim 6, wherein the mounting rack is mounted in an electromagnetic shielding case, the electromagnetic shielding case is provided with a door, and an inner wall of the electromagnetic shielding case and an inner surface of the door are both provided with a wave absorbing foam. ### Claim 8 (depends on 1) The polygonal spherical space sampling device according to claim 1, wherein both the top and outer peripheral sidewalls of the mounting rack are provided with a metal wiring box. ### Claim 9 (depends on 1) The polygonal spherical space sampling device according to claim 1, wherein the mounting rack is welded from steel plates and/or assembled from steel plates by bolts, and a part of the steel plates is provided with perforations.