# US 11,442,087 B2 · Adaptive power measurement accumulator with a changing sampling frequency > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 11,442,087 B2 - Document ID: US11442087B2 - Status: Granted - Kind: B2 - Application number: 16/506,492 - Filed: 2019-07-09 - Published: 2020-10-29 - Granted: 2022-09-13 - Earliest claimed: 2019-04-25 - Assignees: Microchip Technology Incorporated - Applicants: Microchip Technology Incorporated - Inventors: Razvan Ionut Ungureanu; Thomas Anderson - Web page: https://patentgrep.com/patent/US11442087B2 ## CPC - G01R 19/2513: {Arrangements for monitoring electric power systems, e.g. power lines or loads; Logging} - G01R 22/061: {Details of electronic electricity meters} - G01R 21/133: by using digital technique - G01R 22/10: using digital techniques - G01R 35/04: of instruments for measuring time integral of power or current - G01R 31/382: Arrangements for monitoring battery or accumulator variables, e.g. SoC - H01M 10/48: Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte (constructional details of current conducting connections for detecting conditions inside cells or batteries, e.g. details of voltage sensing terminals, H01M50/569) - Y02E 60/10: Energy storage using batteries - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - H01M: PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY - Y02E: REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION ## Abstract A power meter includes a sampling circuit configured to initially make electrical measurements of a unit under test at a first sampling frequency. The power meter includes an adaptive circuit. The power meter includes an accumulator configured to accumulate electrical measurements of the unit under test from the sampling circuit. After a change in sampling frequency from the first sampling frequency to a second sampling frequency, the sampling circuit makes second electrical measurements at the second sampling frequency. The adaptive circuit is configured to adjust the second electrical measurements from the sampling circuit according to a factor. The factor is based on a relationship between the first sampling frequency and the second sampling frequency. The adjustment yields adjusted second electrical measurements. The accumulator is further configured to accumulate the adjusted second electrical measurements. ## Claims ### Claim 1 An apparatus, comprising: a sampling circuit to initially make electrical measurements of a unit under test at a first sampling frequency; an adaptive circuit; and an accumulator to accumulate electrical measurements of the unit under test from the sampling circuit including a plurality of first electrical measurements at the first sampling frequency; wherein, after a change in sampling frequency from the first sampling frequency to a second sampling frequency: the sampling circuit is to make a plurality of second electrical measurements at the second sampling frequency; the adaptive circuit is to adjust a value of the plurality of second electrical measurements from the sampling circuit according to a factor, wherein the factor is a multiplication factor, the factor based on a relationship between the first sampling frequency and the second sampling frequency, to yield a plurality of adjusted second electrical measurements; and the accumulator is to accumulate the plurality of adjusted second electrical measurements with the first electrical measurements. ### Claim 2 (depends on 1) The apparatus of claim 1, wherein the accumulator is to accumulate the plurality of adjusted second electrical measurements made at the second sampling frequency with the plurality of first electrical measurements made at the first sampling frequency without resetting a value of the accumulator. ### Claim 3 (depends on 1) The apparatus of claim 1, comprising a sample counter to: initially accumulate a count of the plurality of electrical measurements made by the sampling circuit at the first sampling frequency; and after a change from the first sampling frequency to the second sampling frequency, accumulate the count of the plurality of second electrical measurements made by the sampling circuit at the second sampling frequency, the count of the plurality of second electrical measurements made by the sampling circuit at the second sampling frequency adjusted by the factor. ### Claim 4 (depends on 1) The apparatus of claim 1, wherein the adaptive circuit is to receive an indication that the plurality of second electrical measurements are to be made at the second sampling frequency instead of the first sampling frequency. ### Claim 5 (depends on 4) The apparatus of claim 4, wherein the adaptive circuit is to receive the indication that the plurality of second electrical measurements are to be made at the second sampling frequency instead of the first sampling frequency without notification to a central processing unit, the central processing unit to use a value of the accumulator. ### Claim 6 (depends on 1) The apparatus of claim 1, wherein the accumulator is to provide a single value of accumulated electrical measurements, the accumulated electrical measurements including electrical measurements made with both the first sampling frequency and the second sampling frequency. ### Claim 7 (depends on 1) The apparatus of claim 1, wherein: the adaptive circuit includes a shift circuit; the factor is given as 2S, wherein 2S is equal to a ratio of the first sampling frequency to the second sampling frequency; and the shift circuit is to shift an accumulated value of electrical measurements by S bits. ### Claim 8 A method, comprising with a sampling circuit, initially making electrical measurements of a unit under test at a first sampling frequency including a plurality of first electrical measurements at the first sampling frequency; with an accumulator, accumulating electrical measurements of the unit under test; with an adaptive circuit, determining a change in sampling frequency from the first sampling frequency to a second sampling frequency; with the sampling circuit, making a plurality of second electrical measurements at the second sampling frequency after determining the change in sampling frequency; with the adaptive circuit, adjusting a value of the second electrical measurements according to a factor, wherein the factor is a multiplication factor, the factor based on a relationship between the first sampling frequency and the second sampling frequency, to yield a plurality of adjusted second electrical measurements; and with the accumulator, accumulating the plurality of adjusted second electrical measurements with the plurality of first electrical measurements. ### Claim 9 (depends on 8) The method of claim 8, comprising accumulating the plurality of adjusted second electrical measurements made at the second sampling frequency with the plurality of first electrical measurements made at the first sampling frequency without resetting a value of accumulation. ### Claim 10 (depends on 8) The method of claim 8, comprising: maintaining a sample count; initially accumulating a count of the plurality of first electrical measurements made at the first sampling frequency in the sample count; and after a change from the first sampling frequency to the second sampling frequency, accumulating the count of the plurality of second electrical measurements made at the second sampling frequency in the sample count, the count of the plurality of second electrical measurements made at the second sampling frequency adjusted by the factor. ### Claim 11 (depends on 8) The method of claim 8, comprising receiving an indication that electrical measurements are to be made at the second sampling frequency instead of the first sampling frequency. ### Claim 12 (depends on 11) The method of claim 11, comprising receiving the indication that electrical measurements are to be made at the second sampling frequency instead of the first sampling frequency without notification to a central processing unit, the central processing unit to use a value of the accumulator. ### Claim 13 (depends on 8) The method of claim 8, comprising providing a single value of accumulated electrical measurements, the accumulated electrical measurements including electrical measurements made with both the first sampling frequency and the second sampling frequency. ### Claim 14 (depends on 8) The method of claim 8, wherein: the adjustment is performed with a shift circuit; the factor is given as 2S, wherein 2S is equal to a ratio of the first sampling frequency to the second sampling frequency; and the method comprises using the shift circuit to shift an accumulated value of electrical measurements by S bits. ### Claim 15 A system, comprising: a processor; and a power meter, including: a sampling circuit to initially make electrical measurements of a unit under test at a first sampling frequency; an adaptive circuit; and an accumulator to accumulate electrical measurements of the unit under test from the sampling circuit including a plurality of first electrical measurements at the first sampling frequency; wherein, after a change in sampling frequency from the first sampling frequency to a second sampling frequency: the sampling circuit is to make a plurality of second electrical measurements at the second sampling frequency; the adaptive circuit is to adjust a value of the plurality of second electrical measurements from the sampling circuit according to a factor, wherein the factor is a multiplication factor, the factor based on a relationship between the first sampling frequency and the second sampling frequency, to yield a plurality of adjusted second electrical measurements; the accumulator is to accumulate the plurality of adjusted second electrical measurements; and the accumulator is to provide an accumulation of adjusted second electrical measurements to the processor with the first electrical measurements. ### Claim 16 (depends on 15) The system of claim 15, wherein the accumulator is to accumulate the plurality of adjusted second electrical measurements made at the second sampling frequency with the plurality of first electrical measurements made at the first sampling frequency without resetting a value of the accumulator. ### Claim 17 (depends on 15) The system of claim 15, comprising a sample counter to: initially accumulate a count of the plurality of first electrical measurements made by the sampling circuit at the first sampling frequency; and after a change from the first sampling frequency to the second sampling frequency, accumulate the count of the plurality of second electrical measurements made by the sampling circuit at the second sampling frequency, the count of the plurality of second electrical measurements made by the sampling circuit at the second sampling frequency adjusted by the factor. ### Claim 18 (depends on 15) The system of claim 15, wherein the adaptive circuit is to receive an indication that electrical measurements are to be made at the second sampling frequency instead of the first sampling frequency. ### Claim 19 (depends on 18) The system of claim 18, wherein the adaptive circuit is to receive the indication that electrical measurements are to be made at the second sampling frequency instead of the first sampling frequency without notification to the processor. ### Claim 20 (depends on 15) The system of claim 15, wherein the accumulator is to provide a single value of accumulated electrical measurements, the accumulated electrical measurements including electrical measurements made with both the first sampling frequency and the second sampling frequency.