Detector for X-ray imaging

A method for X-ray imaging, comprising:

• positioning an X-ray detector relative to an X-ray source such that at least a part of a region between the X-ray source and the X-ray detector is an examination region for accommodating an object;
• controlling the X-ray detector and the X-ray source by a processing unit wherein the X-ray detector comprises:
• a first scintillator;
• a second scintillator;
• a first sensor array;
• and
• a second sensor array;
• and
• wherein the first sensor array is associated with the first scintillator, the first sensor array comprising an array of sensor elements configured to detect optical photons generated in the first scintillator;
• wherein the second sensor array is associated with the second scintillator, the second sensor array comprising an array of sensor elements configured to detect optical photons generated in the second scintillator;
• wherein the first scintillator is disposed over the second scintillator such that X-rays emitted from an X-ray source encounter the first scintillator and then encounter the second scintillator;
• wherein the first scintillator has a thickness equal to or greater than approximately 0.6 mm;
• wherein the second scintillator has a thickness equal to or greater than approximately 1.1 mm;
• wherein in a first imaging operation mode the first scintillator and the first sensor array are configured to provide data useable to generate a low energy X-ray image;
• wherein in a second imaging operation mode the second scintillator and the second sensor array are configured to provide data useable to generate a high energy X-ray image;
• and
• wherein in a third imaging operation mode the first scintillator, the first sensor array, the second scintillator and the second sensor array are configured to provide data useable to generate a combined energy X-ray image.