Multi-lane optical-electrical device testing using automated testing equipment

A method for testing of an optical-electrical device under test (DUT) using an automated testing equipment (ATE) system, the method comprising:

• actuating, using a handler of the ATE system, the optical-electrical DUT to connect an electric testing module of the ATE system and connect to an optical testing module of the ATE system, the optical-electrical DUT connected to the electric testing module of the ATE system using electrical connections in a socket that holds the optical-electrical DUT, the optical-electrical DUT connected to the optical testing module of the ATE system using an optical interconnect structure comprising input fibers to input light to the optical-electrical DUT and output fibers to output light from the optical-electrical DUT, each of the output fibers and the input fibers being coupled to the optical-electrical DUT using physical interlocking features of the optical interconnect structure that interlock with the optical-electrical DUT to physically align optical output and input paths of the optical-electrical DUT with each of the output fibers in the input fibers;
• configuring an optical test lane switch selector in a first configuration for optical testing of a first lane of the optical-electrical DUT, the optical-electrical DUT being a multilane optical transceiver comprising a plurality of transceiver lanes including the first lane and a second lane, each lane of the plurality of transceiver lanes modulating light using an optical transmitter for the lane and receiving light using an optical receiver for the lane, the optical test lane switch selector being configured for the first configuration by selecting, using an optical switch in the optical test lane switch selector, one of the output fibers coupled to the optical-electrical DUT to a testing fiber that is coupled to an optical testing device, the optical test lane switch selector being further configured in the first configuration by activating an external light source in the optical test lane switch selector to transmit light to the optical-electrical DUT on one of a the input fibers that are coupled to the optical-electrical DUT;
• calibrating one or more optical components of the first lane of the optical-electrical DUT using the optical testing module while the optical test lane switch selector is in the first configuration and while electrical components of the optical-electrical DUT are electrically connected to the electrical testing module;
• configuring the optical test lane switch selector in a second configuration for optical testing of a second lane of the optical-electrical DUT, wherein the second lane is another lane of the plurality of transceiver lanes, the optical test lane switch selector being configured for the second configuration by selecting, using the optical switch in the optical test lane switch selector, another of the output fibers coupled to the optical-electrical DUT to the testing fiber that is coupled to the optical testing device, the optical test lane switch selector being further configured in the second configuration by activating the external light source of the optical test lane switch selector to transmit light to the optical-electrical DUT on another of the input fibers that are coupled to the optical-electrical DUT;
• calibrating one or more optical components of the second lane of the optical-electrical DUT using the optical testing module while the optical test lane switch selector is in the second configuration and while electrical components of the optical-electrical DUT are electrically connected to the electrical testing module.