Mass spectrometer

A mass spectrometer including:

• an ion source configured to ionize a sample component;
• a cell into which a predetermined gas is introduced, the cell being configured to allow an ion generated in the ion source and an ion originating from the ion generated in the ion source to be in contact with the predetermined gas;
• and a mass spectrometer unit configured to perform mass spectrometry on an ion ejected from the cell or an ion originating from the ion ejected from the cell, the mass spectrometer comprising:
• a skimmer provided between the ion source and the cell, the skimmer having, at its top, an ion passing port;
• an attraction electrode provided between the skimmer and the cell, the attraction electrode being configured to promote attraction of the ion generated in the ion source or the ion originating from the ion generated in the ion source through the ion passing port of the skimmer, using an effect of an electric field during a time period other than a standby period of time in which no analysis-target ion is analyzed;
• a voltage generator configured to apply a direct-current voltage to the attraction electrode;
• and
• a controller configured to control the voltage generator to apply, to the attraction electrode, a direct-current voltage with a polarity same as a polarity of an elimination-target ion generated in the ion source, or a direct-current voltage having no effect in attracting the elimination-target ion, during at least a part of the standby period of time in which no analysis-target ion is analyzed, wherein
• the polarity of an elimination-target ion is same as a polarity of the ion generated in the ion source or the ion originating from the ion generated in the ion source;
• wherein the standby period of time in which no analysis-target ion is analyzed corresponds to a time period from a time point where introduction of the predetermined gas into the cell is started to a time point where the cell is filled with the predetermined gas.

A mass spectrometer including:

• an ion source configured to ionize a sample component;
• a cell into which a predetermined gas is introduced, the cell being configured to allow an ion generated in the ion source and an ion originating from the ion generated in the ion source to be in contact with the predetermined gas;
• and a mass spectrometer unit configured to perform mass spectrometry on an ion ejected from the cell or an ion originating from the ion ejected from the cell, the mass spectrometer comprising:
• a skimmer provided between the ion source and the cell, the skimmer having, at its top, an ion passing port;
• an attraction electrode provided between the skimmer and the cell, the attraction electrode being configured to promote attraction of the ion generated in the ion source or the ion originating from the ion generated in the ion source through the ion passing port of the skimmer, using an effect of an electric field during a time period other than a standby period of time in which no analysis-target ion is analyzed;
• a voltage generator configured to apply a direct-current voltage to the attraction electrode;
• and
• a controller configured to control the voltage generator to apply, to the attraction electrode, a direct-current voltage with a polarity same as a polarity of an elimination-target ion generated in the ion source, or a direct-current voltage having no effect in attracting the elimination-target ion, during at least a part of the standby period of time in which no analysis-target ion is analyzed, wherein
• the polarity of an elimination-target ion is same as a polarity of the ion generated in the ion source or the ion originating from the ion generated in the ion source, and
• the ion source is an inductively coupled plasma ion source, the cell is a collision cell for removing an interference ion, the elimination-target ion is an ion originating from a plasma gas used in the ion source.