Modular data center testing
AssigneeDell Products L.P.
InventorsJeffery T. Sayles, Mario E. Salazar Granados
Life of this patent
Estimating the term…
Loading patent…
AssigneeDell Products L.P.
InventorsJeffery T. Sayles, Mario E. Salazar Granados
Estimating the term…
A test controller functionally tests components of a modular data center (MDC) that is being manufactured. Functional test(s) for quality assurance of an environmental control system (ECS) are determined for an information technology pre-assembled component (ITPAC) module and an environmental system (ES) module that are configured for being coupled together for cooling of heat-generating equipment of the ITPAC module at a deployed location. For each functional test(s), the test controller identifies input signal value(s) associated with one of the modules. The test controller emulates, via a communication test cable connected between the one module and the test controller, the identified input signal value(s). The test controller determines, via the communication test cable, any response by the one module to the input signal value(s). The test controller compares the determined response to an expected response and generates and outputs test data based on the comparison.
An information handling system (IHS) comprising:
A method for functionally testing components of modular data centers that are being manufactured, the method comprising:
A method for testing and separately deploying components of a modular data center (MDC), the method comprising:
Dependencies are inferred from the claim text.