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US 11,388,357 B2Granted
Solid-state imaging element, test system, and control method for solid-state imaging element
AssigneeSony Semiconductor Solutions Corporation
InventorAtsumi Niwa
Life of this patent
Estimating the term…
Abstract
Presence or absence of an abnormality is easily determined in a solid-state imaging element that detects an address event. The solid-state imaging element includes a photoelectric conversion element, a test signal supply unit, a selection unit, and a comparator. The photoelectric conversion element converts incident light into an electric signal by photoelectric conversion. The test signal supply unit supplies, as a test signal, a signal that fluctuates with time. The selection unit selects either the electric signal or the test signal. The comparator compares a predetermined threshold value with the signal selected by the selection unit, and outputs a result of the comparison.
Claims17
A solid-state imaging element comprising:
- a photodiode configured to convert incident light into an electric signal by photoelectric conversion;
- test signal supply circuitry configured to supply a test signal;
- selection circuitry configured to select either the electric signal or the test signal;
- a comparator configured to receive the electric signal and the test signal, and to compare a predetermined threshold value with either the electric signal or the test signal, depending upon the signal selected by the selection circuitry, and output a result of the comparison;
- a current-voltage conversion circuit configured to convert a current signal into a voltage signal, wherein the photodiode outputs the current signal as the electric signal to the current-voltage conversion circuit;
- a buffer configured to output a buffer input signal as a buffer output signal;
- and
- a subtractor configured to output, as a differential signal, a change amount of a signal to be differentiated by subtraction.
5 more elements
A test system comprising:
- a photodiode configured to convert incident light into an electric signal by photoelectric conversion;
- test signal supply circuitry configured to supply a test signal;
- selection circuitry configured to select either the electric signal or the test signal;
- a comparator configured to receive the electric signal and the test signal, and to compare a predetermined threshold value with either the electric signal or the test signal, depending upon the signal selected by the selection circuitry, and output a result of the comparison;
- abnormality determination circuitry configured to determine presence or absence of an abnormality on a basis of the comparison result;
- and
- a signal processing circuit configured to invalidate an address event detection circuit having an abnormality out of a plurality of address event detection circuits, wherein
- the selection circuitry and the comparator are arranged in each of the plurality of address event detection circuits, and
- the abnormality determination circuitry determines presence or absence of an abnormality with regard to each of the plurality of address event detection circuits.
6 more elements
A control method for a solid-state imaging element, comprising:
- supplying, as a test signal;
- selecting, by selection circuitry, either the test signal or an electric signal generated by a photodiode that converts incident light into the electric signal by photoelectric conversion;
- receiving, by a comparator, the test signal and the electric signal, depending upon the signal selected by the selection circuitry, and comparing a predetermined threshold value with either the test signal or the electric signal, depending upon the signal selected by the selection circuitry;
- outputting a result of the comparison;
- converting, by a current-voltage conversion circuit, a current signal into a voltage signal, wherein the photodiode outputs the current signal as the electric signal to the current-voltage conversion circuit;
- outputting, by a buffer, a buffer input signal as a buffer output signal;
- and
- outputting, by a subtractor, as a differential signal, a change amount of a signal to be differentiated by subtraction.
5 more elements
A test system comprising:
- a photodiode configured to convert incident light into an electric signal by photoelectric conversion;
- test signal supply circuitry configured to supply a test signal;
- selection circuitry configured to select either the electric signal or the test signal;
- a comparator configured to receive the electric signal and the test signal, and to compare a predetermined threshold value with either the electric signal or the test signal, depending upon the signal selected by the selection circuitry, and output a result of the comparison;
- abnormality determination circuitry configured to determine presence or absence of an abnormality on a basis of the comparison result;
- a current-voltage conversion circuit configured to convert a current signal into a voltage signal;
- a buffer configured to output a buffer input signal as a buffer output signal;
- and
- a subtractor configured to output, as a differential signal, a change amount of a signal to be differentiated by subtraction,
- wherein the photodiode outputs the current signal as the electric signal to the current-voltage conversion circuit.
7 more elements
Dependencies are inferred from the claim text.