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US 11,386,973 B2Granted
Method and apparatus for built in redundancy analysis with dynamic fault reconfiguration
AssigneeIndustry-Academic Cooperation Foundation, Yonsei University
InventorsSungho Kang, Ha Young Lee
Life of this patent
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Abstract
The present embodiments provides a memory repair solution finding device and method which find a fault by testing a memory and find a repair solution in parallel and dynamically reconfigure the stored fault information to minimize a repair solution searching time with an optimal repair rate.
Claims17
A memory repair solution finding device, comprising:
- a fault information memory which stores fault information of a base memory;
- and
- a controller which is connected to the fault information memory and transmits a command for reconfiguring a location where the fault information of the base memory is stored to the fault information memory,
- wherein after collecting first fault information at a first timing by testing the base memory, the fault information memory stores the first fault information, and after collecting second fault information at a second timing by testing the base memory, the fault information memory stores the second fault information, and
- wherein the location where the first fault information is stored in the fault information memory is reconfigured between the first timing and the second timing before storing the second fault information in the fault information memory.
2 more elements
A memory repair solution finding method, comprising:
- collecting fault information of a base memory to store the fault information in a fault information memory;
- and
- analyzing the fault information to derive a repair solution while collecting the fault information,
- wherein in the storing of the fault information, after collecting first fault information at a first timing by testing the base memory, the first fault information is stored in the fault information memory, and after collecting second fault information at a second timing by testing the base memory, the second fault information is stored in the fault information memory, and
- wherein in the deriving of the repair solution, a location of an address for the first fault information stored in the fault information memory is reconfigured between the first timing and the second timing before storing the second fault information in the fault information memory.
2 more elements
Dependencies are inferred from the claim text.