Systems and methods for management of organic light-emitting diode display degradation
AssigneeDell Products L.P.
InventorsDeeder M. Aurongzeb, Philip Conde, Nick Luna
Life of this patent
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Abstract
An information handling system may include a display comprising an organic light-emitting diode (OLED) panel and an OLED degradation management subsystem configured to, responsive to a condition for initiating a calibration of the OLED panel, logically divide the OLED panel into a plurality of non-overlapping test windows of a defined size, measure a physical quantity for a pixel of at least one of the plurality of non-overlapping test windows to determine a deviation of the at least one test window from a linear degradation profile, and correct for non-linear degradation occurring in the at least one test window based on the deviation.
Claims18
An information handling system comprising:
- a display comprising an organic light-emitting diode (OLED) panel;
- and
- an OLED degradation management subsystem configured to, responsive to a condition for initiating a calibration of the OLED panel:
- logically divide the OLED panel into a plurality of non-overlapping test windows of a defined size wherein the defined size decreases over a lifecycle of the OLED panel;
- obtain a measured value of a physical quantity for a pixel of at least one of the plurality of non-overlapping test windows;
- determine a deviation of the at least one test window based on a difference between the measured value and a profile value associated with a linear degradation profile of the physical quantity, wherein the linear degradation profile indicates projected values of the physical property as a function of time;
- and
- correct for non-linear degradation occurring in the at least one test window based on the deviation.
A method comprising:
- logically dividing an organic light-emitting diode (OLED) panel into a plurality of non-overlapping test windows of a defined size wherein the defined size decreases over a lifecycle of the OLED panel;
- obtaining a measured value of a physical quantity for a pixel of at least one of the plurality of non-overlapping test windows;
- determining a deviation of the at least one test window based on a difference between the measured value and a profile value associated with a linear degradation profile of the physical Quantity, wherein the linear degradation profile indicates projected values of the physical property as a function of time;
- and
- correcting for non-linear degradation occurring in the at least one test window based on the deviation.
An article of manufacture comprising:
- a non-transitory computer-readable medium;
- and
- computer-executable instructions carried on the computer-readable medium, the instructions readable by a processor, the instructions, when read and executed, for causing the processor to:
- logically divide an organic light-emitting diode (OLED) panel into a plurality of non-overlapping test windows of a defined size wherein the defined size decreases over a lifecycle of the OLED panel;
- obtain a measured value of a physical quantity for a pixel of at least one of the plurality of non-overlapping test windows;
- determine a deviation of the at least one test window based on a difference between the measured value and a profile value associated with a linear degradation profile of the physical quantity, wherein the linear degradation profile indicates values of the physical property as a function of time;
- and
- correct for non-linear degradation occurring in the at least one test window based on the deviation.
Dependencies are inferred from the claim text.