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US 11,386,570 B2Granted
Measurement method and measurement apparatus
AssigneeKabushiki Kaisha Toshiba
InventorsKiminori Toya, Hiroshi Ohno
Life of this patent
Estimating the term…
Abstract
According to one embodiment, a measurement method includes: acquiring a first picture including a background image and a substance, the substance allowing transmission of light from the background image; acquiring a second picture including the background image and the substance in a different positional relation with respect to the first picture; and calculating a first displacement amount representing a difference in position of the background image between the first picture and the second picture.
Claims9
A measurement method, comprising:
- acquiring a first picture including a background image and a substance, the substance allowing transmission of light from the background image;
- acquiring a second picture including the background image and the substance in a different positional relation with respect to the first picture;
- and
- calculating a first displacement amount representing a difference in position of the background image between the first picture and the second picture.
1 more element
A measurement apparatus, comprising:
- an imaging device that acquires a first picture and a second picture, the first picture and the second picture each including a background image and a substance, the substance allowing transmission of light from the background image;
- and
- a first displacement calculator that calculates a first displacement amount representing a difference in position of the background image between the first picture and the second picture, wherein
- the second picture differs from the first picture in positional relation between the background image and the substance in the direction orthogonal to the optical axis along which the first picture is acquired.
1 more element
Dependencies are inferred from the claim text.