Abnormality inspection device and abnormality inspection method

An abnormality inspection device comprising processing circuitry

• to acquire a determination target image in which a target object to be inspected is captured;
• to acquire a result of machine learning of forward domain conversion of an image or inverse domain conversion of an image performed using a normal image in which the target object in a normal state is captured as training data;
• to obtain a domain-converted image by sequentially performing forward domain conversion and inverse domain conversion on the determination target image, using the result of the machine learning;
• to determine whether or not an abnormality is occurring in the target object captured in the determination target image by comparing the determination target image and the domain-converted image;
• to obtain a forward-domain-converted image by performing forward domain conversion on the determination target image using a result of machine learning performed using the normal image as training data;
• and
• to perform analysis on the abnormality using the forward-domain-converted image when the abnormality is determined to be occurring in the target object captured in the determination target image.