Semiconductor structure and method for forming ihe same
AssigneeWinbond Electronics Corp.
InventorChe-Fu Chuang
Life of this patent
Estimating the term…
Abstract
A method for manufacturing a semiconductor device is provided. The method includes the following steps: forming a lining layer on a substrate and a plurality of gate structures; forming a first spacer layer on the lining layer; forming a stop layer on the first spacer layer; forming a first sacrificial layer on the stop layer and between the gate structures; removing a portion of the first sacrificial layer so that the top surface of the first sacrificial layer is located between the upper portions of the gate structures; forming a second spacer layer on the first sacrificial layer and the gate structures; and removing a portion of the second spacer layer so that the remaining second spacer layer is located between the upper portions of the gate structures.
Claims20
A method for manufacturing a semiconductor structure, comprising:
- providing a substrate;
- forming a plurality of gate structures on the substrate;
- forming a lining layer on the substrate and the plurality of gate structures;
- forming a first spacer layer on the lining layer;
- forming a stop layer on the first spacer layer;
- forming a first sacrificial layer on the stop layer and between the plurality of gate structures;
- removing a portion of the first sacrificial layer so that a top surface of the first sacrificial layer is located between upper portions of the plurality of gate structures;
- forming a second spacer layer on the first sacrificial layer and the plurality of gate structures;
- removing a portion of the second spacer layer so that the remaining second spacer layer is located between the upper portions of the plurality of gate structures;
- forming a second sacrificial layer on the plurality of gate structures and between the plurality of gate structures;
- removing the first sacrificial layer and the second sacrificial layer, and removing portions of the lining layer, the first spacer layer and the stop layer to form a plurality of contact openings between the plurality of gate structures, wherein the plurality of contact openings expose a part of the surface of the substrate;
- and
- filling a conductive material into the plurality of contact openings to form a plurality of contact plugs.
A semiconductor structure, comprising:
- a substrate;
- a plurality of gate structures located on the substrate;
- a lining layer located on the plurality of gate structures;
- a first spacer layer located on the lining layer;
- a stop layer located on the first spacer layer;
- a second spacer layer located between upper portions of the plurality of gate structures;
- and
- a plurality of contact plugs located between the plurality of gate structures.
Dependencies are inferred from the claim text.