Operating a particle beam generator for a particle beam device
AssigneeCarl Zeiss Microscopy GmbH
InventorDirk Preikszas
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AssigneeCarl Zeiss Microscopy GmbH
InventorDirk Preikszas
Estimating the term…
A particle beam generator for a particle beam device may be operated. A liquid metal may be provided from a container of a particle source to an emission device of the particle source and a first heating cycle for cleaning the particle source performed, which may comprise supplying a heating current to a heating device arranged at the emission device using a current supply unit, heating the emission device during a heating time period, measuring a value of a voltage drop at the heating device and/or at the current supply unit and adjusting at least one of: the heating current and the heating time period using the current supply unit, depending on the measured value of the voltage drop. A second heating cycle for cleaning the particle source may include using at least one of: the adjusted heating current and the adjusted heating time period, for heating the emission device.
A method of operating a particle beam generator for a particle beam device, comprising:
A computer program product including a program code which is loaded into a processor and which, when being executed, controls a particle beam device in such a way that a method of operating a particle beam generator for a particle beam device is carried out, the method comprising:
A particle beam device for imaging, analyzing and/or processing an object, comprising:
A method of operating a particle beam generator for a particle beam device, comprising:
Dependencies are inferred from the claim text.