Image inspection device and image forming system
AssigneeKonica Minolta, Inc.
InventorsYusuke Mimura, Makoto Oki
Life of this patent
Estimating the term…
Loading patent…
AssigneeKonica Minolta, Inc.
InventorsYusuke Mimura, Makoto Oki
Estimating the term…
An image inspection device that determines a defect in an image of a surface to be inspected of a printed matter, based on a comparison between a captured image obtained by capturing the surface to be inspected and a master image includes a hardware processor that acquires the captured image and the master image, wherein the hardware processor: acquires region information about an image in a region having a predetermined area; specifies a processing technique of image alignment for each region in relation to the region information; executes at least an alignment process in relation to the region information as a process before the comparison by the specified alignment technique; and compares the captured image and the master image, on which the process before the comparison has been performed, and performs defect determination as to whether there is a defect in the captured image based on a comparison result.
An image inspection device that determines a defect in an image of a surface to be inspected of a printed matter, based on a comparison between a captured image obtained by capturing the surface to be inspected and a master image, wherein the master image is a previously prepared correct image,
Dependencies are inferred from the claim text.