System analysis method, system analysis apparatus, and program
AssigneeNEC Corporation
InventorMasanao Natsumeda
Life of this patent
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AssigneeNEC Corporation
InventorMasanao Natsumeda
Estimating the term…
A system analysis method includes: acquiring history information indicating, based on sensor values outputted by sensors, whether one of sensor values outputted by respective sensors indicates abnormality and/or whether individual relationship between sensor values outputted by different sensors indicates abnormality in time-series manner; estimating a change point group of change points, each indicating a time point system state has changed, based on history information; estimating relevance levels, each indicating relevance to the system state between two arbitrary time points included in the change point group; generating groups of change point groups by classifying the change point group into a plurality of groups based on the history information and the relevance levels; and generating and outputting output information, as information relating abnormality per group of the change point groups.
A system analysis method, comprising:
A system analysis apparatus, comprising:
A non-transient computer-readable storage medium stored a program, causing a computer to execute:
Dependencies are inferred from the claim text.