Apparatus for prediction of failure of a functional circuit

An apparatus, comprising:

• a first functional circuit comprising one or more first circuit components configured to perform a function based on one or more first input signals;
• a first failure-prediction circuit for use in predicting failure of the first functional circuit, the first failure-prediction circuit comprising one or more first replica circuit components of the first functional circuit;
• wherein the failure-prediction circuit is configured to be more susceptible to failure than said functional circuit in terms of:
• (a) the one or more first replica circuit components are fabricated having one or more dimensions more susceptible to failure than the corresponding dimensions of the associated first circuit components;
• (b) the first failure-prediction circuit being provided with one or more second input signals based on the one or more first input signals, the one or more second input signals comprising at least one property that is greater in magnitude than the corresponding property of the one or more first input signals;
• and
• (c) the first failure-prediction circuit is positioned relative to the first functional circuit such that, in use, the first failure-prediction circuit experiences a higher operating temperature than the first functional circuit;
• wherein the electronic device is configured to provide a prediction of failure of the first functional circuit based on a determination of failure of the first failure-prediction circuit;
• and
• a second failure-prediction circuit for use in predicting failure of the first functional circuit, the second failure-prediction circuit comprising one or more second replica circuit components of the first circuit components,
• wherein the second failure-prediction circuit is configured to be more susceptible to failure than said first failure-prediction circuit in terms of the one or more circuit components of the second failure-prediction circuit are fabricated having one or more dimensions more susceptible to failure than the corresponding dimensions of the first failure-prediction circuit, and
• wherein the second failure-prediction circuit is configured to be provided with one or more third input signals based on the one or more first input signals, the one or more third input signals comprising at least one property that is greater in magnitude than the corresponding property of the one or more second input signals.

A method for providing prediction of failure of a functional circuit of an apparatus, the apparatus comprising:

• the functional circuit comprising one or more functional circuit components configured to perform a function based on one or more first input signals;
• a first failure-prediction circuit for use in predicting failure of the functional circuit, the first failure-prediction circuit comprising one or more first replica circuit components of the functional circuit components;
• wherein the first failure-prediction circuit is configured to be more susceptible to failure than said functional circuit in terms of one or more of:
• (a) the first failure-prediction circuit is configured to be provided with one or more second input signals based on the one or more first input signals, the one or more second input signals comprising at least one property that is greater in magnitude than the corresponding property of the one or more first input signals;
• (b) the first failure-prediction circuit is positioned relative to the functional circuit such that, in use, the first failure-prediction circuit experiences a higher environmental operating condition than the functional circuit;
• and
• (c) the first failure-prediction circuit is positioned relative to the functional circuit such that, in use, the first failure-prediction circuit experiences a higher operating temperature than the first functional circuit;
• a second failure-prediction circuit for use in predicting failure of the functional circuit, the second failure-prediction circuit comprising one or more second replica circuit components of the first circuit components,
• wherein the second failure-prediction circuit is configured to be more susceptible to failure than said first failure-prediction circuit in terms of the one or more circuit components of the second failure-prediction circuit are fabricated having one or more dimensions more susceptible to failure than the corresponding dimensions of the first failure-prediction circuit, and
• wherein the second failure-prediction circuit is configured to be provided with one or more third input signals based on the one or more first input signals, the one or more third input signals comprising at least one property that is greater in magnitude than the corresponding property of the one or more second input signals;
• and
• the method comprising:
• determining a failure of the failure-prediction circuit;
• and
• predicting the failure of the functional circuit based on determining the failure of the failure-prediction circuit.