Automated spectral library retention time correction
AssigneeDH Technologies Development Pte. Ltd.
InventorStephen A. Tate
Life of this patent
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AssigneeDH Technologies Development Pte. Ltd.
InventorStephen A. Tate
Estimating the term…
A plurality of measured product ion spectra is produced using a DIA tandem mass spectrometry method. One or more product ions are retrieved from a spectral library of known compounds or one or more theoretical product ions are calculated for the known compounds of a database. For each known or theoretical product ion, an XIC is calculated from the measured product ion spectra. Measured XIC peaks above a threshold intensity are grouped for the known compounds producing a subset of known compounds. Known or theoretical retention times are retrieved or calculated for the subset of known compounds. A regression function is calculated to correct the known or theoretical retention times using the known or theoretical retention times of the subset of known compounds as the independent variables and the measured retention times of the measured XIC peak groups of the subset of known compounds as the dependent variables.
A system for automatically calculating a regression function to describe how the known retention times of a spectral library of known compounds are varied by the sample in a tandem mass spectrometry data independent acquisition (DIA) experiment, comprising:
A system for automatically calculating a regression function to describe how the theoretical retention times of the theoretical product ions of known compounds are varied by the sample in a tandem mass spectrometry data independent acquisition (DIA) experiment, comprising:
A method for automatically calculating a regression function to describe how the known retention times of a spectral library of known compounds are varied by the sample in a tandem mass spectrometry data independent acquisition (DIA) experiment, comprising:
Dependencies are inferred from the claim text.