Fine particle measuring device and fine particle measuring method
AssigneeSony Corporation
InventorKatsutoshi Tahara
Life of this patent
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Abstract
Provided is a fine particle measuring device and the like at least including at least two light sources having different wavelength region, a detection unit that detects light from a fluorescent reference particle in accordance with excitation light from the light sources, and an information processing unit that compares, on the basis of information detected by the detection unit, a feature quantity of an output pulse based on a reference light source among the plurality of light sources with a feature quantity of an output pulse based on at least another light source among the plurality of light sources, and adjusts an output of the another light source.
Claims17
A fine particle measuring device, comprising:
- at least two light sources that include a first light source and a second light source, wherein
- the first light source is a reference light source,
- the first light source corresponds to a first wavelength region, and
- the second light source corresponds to a second wavelength region different from the first wavelength region;
- a detection unit configured to detect light from a fluorescent reference particle based on excitation light from the at least two light sources;
- and
- an information processing unit configured to:
- compare, based on the detection of the light, a feature quantity of a first output pulse with a feature quantity of a second output pulse, wherein
- the feature quantity of the first output pulse is based on the reference light source, and
- the feature quantity of the second output pulse is based on the second light source;
- and
- adjust an output of the second light source based on the comparison.
A fine particle measuring method, comprising:
- detecting light from a fluorescent reference particle based on excitation light from at least two light sources, wherein
- the at least two light sources include a first light source and a second light source,
- the first light source is a reference light source,
- the first light source corresponds to a first wavelength region, and
- the second light source corresponds to a second wavelength region different from the first wavelength region;
- and
- comparing, based on the detection of the light, a feature quantity of a first output pulse with a feature quantity of a second output pulse, wherein
- the feature quantity of the first output pulse is based on the reference light source
- the feature quantity of the second output pulse is based on the second light source;
- and adjusting an output of the second light source based on the comparison.
Dependencies are inferred from the claim text.