Instrumental analysis systems and methods
AssigneeMontana Instruments Corporation
InventorsWilliam Baker, Isaac Henslee, Luke Mauritsen, Anjan Reijnders
Life of this patent
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Abstract
Instrumental analysis systems are provided that can include: an analytical attachment axially aligned with a sample upon a sample stage; structure supporting both the attachment and the sample stage; and at least one band affixed to the analytical attachment and aligned symmetrically about the axis of the attachment. Methods for analyzing samples are provided. The methods can include: providing at least one band supported by a structure; firmly affixing an analytical attachment to the band, and axially aligning the attachment with a sample; and providing a temperature gradient between the band and the sample while maintaining axial alignment of the objective and the sample.
Claims13
A cryogenic instrumental analysis system comprising:
- an analytical attachment axially aligned with a sample upon a sample stage, wherein the sample stage is configured to support a sample during cryogenic analysis;
- structure supporting both the attachment and the sample stage;
- one band affixed to the analytical attachment and aligned symmetrically about the axis of the attachment;
- and
- another band structurally supported about the sample stage, the instrument configured to maintain the one and the other bands at different temperatures and flowing thermal energy between the two bands.
Dependencies are inferred from the claim text.