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US 11,378,477 B2Granted
Apparatus for measuring surface profile of normal and shear stress
AssigneeKent State University
InventorsMykhailo Pevnyi, Tianyi Guo, Fred Minkowski, Vincent Hetherington, Hiroshi Yokoyama, Peter Palffy-Muhoray
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Abstract
An apparatus for measuring normal and shear stress at a surface. The apparatus includes a substrate; and a plurality of sensing units on the substrate. Each sensing unit includes a mechanical transducer having a receiving surface and a sensing surface; and a plurality of normal force sensors between the sensing surface and the substrate.
Claims20
An apparatus for measuring a surface profile of shear stress comprising:
- a substrate;
- and
- a plurality of sensing units on the substrate, each sensing unit comprising:
- a mechanical transducer having a receiving surface and a sensing surface;
- and
- a plurality of normal force sensors between the sensing surface and the substrate;
- wherein the mechanical transducer comprises rubber.
4 more elements
An apparatus for measuring a surface profile of shear stress comprising:
- a substrate;
- and
- a sensing unit comprising:
- a mechanical transducer having a receiving surface and a sensing surface;
- and
- a plurality of normal force sensors between the sensing surface and the substrate;
- wherein the mechanical transducer comprises rubber.
4 more elements
Dependencies are inferred from the claim text.