Building inspection and measurement device
OwnerGregory E. Lowitzinventor
Life of this patent
Estimating the term…
Abstract
An inspection and measurement device includes a body defining a first planar face within a first bounded area, a first reference feature disposed on the first planar face within the first bounded area and corresponding with a first measurable parameter, and at least a second reference feature disposed on the first planar face within the first bounded area and corresponding with a second measurable parameter. The first and second reference features are positioned within the first bounded area for placement adjacent an element bearing the respective one of the first and second measurable parameters. The first and second reference features overlap within the first bounded area in at least one direction.
Claims17
An inspection and measurement device, comprising:
- a body defining a first planar face within a first bounded area and a second planar face opposite the first planar face;
- a first reference feature disposed on the first planar face within the first bounded area and corresponding with a first measurable parameter;
- a second reference feature disposed on the first planar face within the first bounded area so as to face the second planar face and corresponding with a second measurable parameter;
- wherein:
- the first and second reference features are positioned within the first bounded area for placement adjacent an element bearing the respective one of the first and second measurable parameters;
- and
- the first and second reference features overlap within the first bounded area in at least two perpendicular directions;
- and
- the first and second reference features are printed on opposite sides of a printing layer applied on the first surface.
An inspection and measurement device, comprising:
- a transparent body defining a first planar face within a first bounded area and a second planar face spaced apart from the first planar face;
- a first reference feature disposed on the first planar face within the first bounded area and corresponding with a first measurable parameter;
- an opaque layer disposed on the first planar face over the first reference feature;
- and
- a second reference feature disposed on the opaque layer and corresponding with a second measurable parameter;
- wherein:
- the first and second reference features are positioned within the first bounded area for placement adjacent an element bearing the respective one of the first and second measurable parameters;
- the first reference feature is visible through the transparent body from toward the second planar face;
- and
- the second reference feature is visible from toward the first planar face.
A method for fabricating an inspection and measurement device, comprising:
- printing a transparent substrate with a printed layer having a solid sub-layer and first and second graphical sub-layers, each including at least one printed reference feature, on opposite sides of the solid sub-layer.
Dependencies are inferred from the claim text.