Fail-safe lockout trip mechanism in a circuit interrupting device
AssigneeSiemens Industry, Inc.
InventorsHugh T. Kinsel, Joselito Endozo, Russell Thomas Watford
Life of this patent
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AssigneeSiemens Industry, Inc.
InventorsHugh T. Kinsel, Joselito Endozo, Russell Thomas Watford
Estimating the term…
A circuit interrupting device with a temperature activated permanent lockout trip mechanism is provided. The temperature activated permanent lockout trip mechanism is located in close proximity to a section of conductor that generates heat. An energized first solenoid generates a magnetic force capable of moving an armature that unlatches a latch releasing a spring to open a main contactor removing power from an electrical circuit. The temperature activated permanent lockout trip mechanism upon reaching a predetermined temperature which is higher than the predetermined temperature threshold of the temperature sensing switch also generates a mechanical force capable of moving the armature that unlatches the latch releasing the spring to open the main contactor removing power from the electrical circuit. Once activated, the temperature activated permanent lockout trip mechanism inhibits the latch from latching which prevents a reset of the circuit interrupting device thus the circuit interrupting device is permanently disabled as the main contactor cannot be closed, and power no longer be reconnected to the electrical circuit.
A circuit interrupting device, comprising:
A method for fail-safe lockout trip in a circuit interrupting device, the method comprising:
A circuit interrupting device, comprising:
Dependencies are inferred from the claim text.