Spatial accuracy correction method and apparatus
AssigneeMitutoyo Corporation
InventorsShinichiro Yanaka, Masayuki Nara
Life of this patent
Estimating the term…
Loading patent…
AssigneeMitutoyo Corporation
InventorsShinichiro Yanaka, Masayuki Nara
Estimating the term…
A method that corrects an error in positioning in a positioning mechanism by using a measurable length value measured by a laser interferometer and a measured value for spatial coordinates measured by the positioning mechanism. The method includes a measurement step in which a retroreflector affixed to a displacer is displaced to a plurality of measurement points, and the measured length value and the measured value at each of the measurement points is acquired; and a parameter calculation step in which a correction parameter is calculated based on the measured value, the measured length value, and the coordinates of a rotation center of the tracking-type laser interferometer. A first correction constant is applied to the measured length value for each measurement line, and a second correction constant different from the first correction constant is applied to the coordinates of the rotation center of the interferometer for each measurement line.
A spatial accuracy correction method having a positioning mechanism displacing a displacement body to a predetermined set of spatial coordinates, the positioning mechanism also having a retroreflector mounted to the displacement body, and a laser interferometer having a reference point and measuring a distance from the reference point to the retroreflector, the method performing spatial accuracy correction of the positioning mechanism using a measured length value measured by the laser interferometer and a measured value for spatial coordinates of the retroreflector measured by the positioning mechanism, the method comprising:
A spatial accuracy correction apparatus comprising:
Dependencies are inferred from the claim text.