Measurement device and material, tester
AssigneeShimadzu Corporation
InventorHiroshi Tsuji
Life of this patent
Estimating the term…
Abstract
In an FPGA, waveform data to be sent from the FPGA to a DAC is stored, and a logical circuit is configured from a detection circuit for extracting test force value and elongation value signal components from a signal input from an ADC, an offset subtractor, and a gain multiplier. The detection circuit extracts a resistance component proportional to the test force and displacement. In the detection circuit, an expression that includes a harmonic component of an odd multiple of the carrier frequency is used as a correlation function for extracting the resistance component. As a result, it is possible to obtain calculation results at a sampling frequency that is higher than the carrier frequency.
Claims5
A measurement device for measuring a change in physical quantity generated in an object to be measured, the measurement device comprising:
- a detector that converts the change in physical quantity generated in the object to be measured into an electric signal and outputs the converted electric signal;
- and
- a sensor amplifier that applies a sinusoidal wave having a predetermined period for driving the detector to the detector and receives a signal output from the detector, wherein the sensor amplifier has a receiving circuit that extracts a component of a physical quantity measured by the detector from a received signal input from the detector to the sensor amplifier, and the receiving circuit uses, as a correlation function for extracting a resistance component converted from the physical quantity from the received signal, a function including:
- a component in synchronization with the sinusoidal wave having the predetermined period;
- and
- an odd harmonic component of the component in synchronization with the sinusoidal wave having the predetermined period.
Dependencies are inferred from the claim text.