Method for optimizing a shearing bench and associated shearing bench
AssigneeArmor
InventorsGildas Hubert, Paul Calvez, Frédéric Thepaut, Christophe Derennes
Life of this patent
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Abstract
The invention relates to a method for optimizing a shearing bench for shearing a film having a thickness less than or equal to 10 microns, the shearing bench comprising a plurality of elements, each element being characterized by a plurality of parameters, the collection of parameters forming the parameters of the shearing bench, the plurality of elements comprising at least one blade assembly comprising a blade and a counter-blade collaborating with the blade, a system for progressing the film, and a system for urging the blade and the counter-blade against one another in order to shear the film.
Claims11
An optimization method for optimizing a shearing bench for shearing a film having a thickness less than or equal to 10 microns, the shearing bench comprising a plurality of elements having a plurality of element parameters that constitute bench parameters of the shearing bench, the plurality of elements comprising:
- at least one blade assembly, each blade assembly comprising a blade and a counter-blade that collaborates with the blade,
- a film progression system for progressing the film, and
- a blade/counter-blade urging system for urging the blade and the counter-blade of each blade assembly against one another in order to shear the film,
- the method including the steps of:
- selecting bench parameters of the shearing bench;
- measuring performance of the shearing bench presenting the selected bench parameters, so as to obtain a measured value;
- and
- comparing the measured value with a desired value;
- wherein when the measured value is strictly lower than the desired value, the steps of selecting, measuring, and comparing are re-iterated by modifying at least one of the selected parameters at each iteration until the measured value at one iteration is greater than or equal to the desired value, and
- wherein either:
- the only bench parameters that vary from one iteration to another are:
- a speed of rotation of each blade,
- a speed of rotation of each counter-blade,
- a speed of progression of the film,
- a thickness of each blade,
- a material of each blade,
- a thickness of each counter-blade, and
- a material of each counter-blade, or
- the only bench parameters that vary from one iteration to another are:
- the speed of rotation of each blade,
- the speed of rotation of each counter-blade,
- the speed of progression of the film,
- a shearing angle formed between each blade and the film, and
- an overlap between the blade and counter-blade of each blade assembly, and
- wherein the selected bench parameters at the last iteration are optimized parameters of the shearing bench.
Dependencies are inferred from the claim text.