Method of manufacturing semiconductor device
AssigneeMitsubishi Electric Corporation
InventorHiroyuki Kawahara
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AssigneeMitsubishi Electric Corporation
InventorHiroyuki Kawahara
Estimating the term…
What is provided here are: a step of forming a first semiconductor layer on a base member; a step of forming a mask on the first semiconductor layer; a step of etching the first semiconductor layer by using the mask, to thereby form a semiconductor structure; a step of forming a second semiconductor layer in a region abutting on a side surface of the semiconductor structure, said second semiconductor layer having a convex portion abutting to the mask; a convex-portion removing step of removing the convex portion by supplying an etching gas thereto; and a regrown-layer forming step of supplying a material gas onto the semiconductor structure and the second semiconductor layer, to thereby form a regrown layer; wherein the convex-portion removing step and the regrown-layer forming step are executed in a same manufacturing apparatus.
A method of manufacturing a semiconductor device, comprising:
Dependencies are inferred from the claim text.