Scanning probe microscope
AssigneeGtheranostics Co., Ltd.
InventorHidemi Shigekawa
Life of this patent
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Abstract
A scanning probe microscope includes: a pump light output unit that emits pump light having a first specified phase to a specimen and performs emission of the pump light a plurality of number of times to excite the specimen; a probe light output unit that emits probe light having a second specified phase to the specimen once while the specimen is excited by one-time emission of the pump light; and a scanning probe that detects, from the specimen, a probe signal corresponding to each one-time emission of the probe light, wherein the pump light output unit or the probe light output unit includes a delay time adjustment unit that adjusts delay time from a start of the emission of the pump light until a start of the emission of the probe light.
Claims6
A scanning probe microscope comprising:
- a pump light output unit that emits pump light having a first specified phase to a specimen and performs emission of the pump light a plurality of number of times to excite the specimen;
- a probe light output unit that emits probe light having a second specified phase to the specimen once while the pump light is emitted once to the specimen;
- and
- a scanning probe that detects, from the specimen, a probe signal corresponding to each one-time emission of the probe light,
- wherein the pump light output unit or the probe light output unit includes a delay time adjustment unit that adjusts delay time from a start of the emission of the pump light until a start of the emission of the probe light.
A scanning probe microscope comprising:
- a pump light output unit that emits pump light having a first specified phase to a specimen and performs emission of the pump light once or more to excite the specimen;
- a probe light output unit that emits probe light having a second specified phase to the specimen twice or more while the pump light is emitted once to the specimen;
- and a scanning probe that detects, from the specimen, a probe signal corresponding to each one-time emission of the probe light.
Dependencies are inferred from the claim text.