# US 11,307,325 B2 · Covert surveillance using multi-modality sensing > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 11,307,325 B2 - Document ID: US11307325B2 - Status: Granted - Kind: B2 - Application number: 16/889,638 - Filed: 2020-06-01 - Published: 2020-12-10 - Granted: 2022-04-19 - Earliest claimed: 2011-02-08 - Assignees: Rapiscan Systems, Inc. - Applicants: Rapiscan Systems, Inc. - Inventors: Edward James Morton - Web page: https://patentgrep.com/patent/US11307325B2 ## CPC - G01V 5/223: {Mixed interrogation beams, e.g. using more than one type of radiation beam} - G01V 5/222: measuring scattered radiation - G01V 5/224: {Multiple energy techniques using one type of radiation, e.g. X-rays of different energies} - G01V: GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS (means for indicating the location of accidentally buried, e.g. snow-buried, persons A63B29/02) ## Abstract The present specification discloses a covert mobile inspection vehicle with a backscatter X-ray scanning system that has an X-ray source and detectors for obtaining a radiographic image of an object outside the vehicle. The systems preferably include at least one sensor for determining a distance from at least one of the detectors to points on the surface of the object being scanned, a processor for processing the obtained radiographic image by using the determined distance of the object to obtain an atomic number of each material contained in the object, and one or more sensors to obtain surveillance data from a predefined area surrounding the vehicle. ## Claims ### Claim 1 An inspection system comprising: an X-ray scanning system comprising an X-ray source configured to emit X-ray beams and a plurality of detectors configured to acquire data representative of a radiographic image of an object located proximate to the inspection system; one or more sensors adapted to determine data representative of a distance from at least one of the plurality of detectors to an area on a surface of the object; and a processor configured to process the obtained radiographic image, wherein the processor is configured to apply a correction to the obtained radiographic image based on the determined data representative of the distance. ### Claim 2 (depends on 1) The inspection system of claim 1, wherein the correction is a modification of a brightness of the obtained radiographic image based on the determined data representative of the distance. ### Claim 3 (depends on 1) The inspection system of claim 1, wherein the correction is a modification of an intensity of the obtained radiographic image based on the determined data representative of the distance. ### Claim 4 (depends on 3) The inspection system of claim 3, wherein the modification of the intensity of the obtained radiographic image comprises applying an intensity correction to the obtained radiographic image such that the intensity of the obtained radiographic image located at a distance greater than a first predefined distance is reduced by a first predefined factor and the intensity of the obtained radiographic image located at a distance less than a second predefined distance to be increased by a second predefined factor. ### Claim 5 (depends on 1) The inspection system of claim 1, wherein the correction is a geometric correction of the obtained radiographic image to generate an accurate representation of a shape of an object in the obtained radiographic image. ### Claim 6 (depends on 5) The inspection system of claim 5, wherein the one or more sensors comprises a light-based range finder system. ### Claim 7 (depends on 6) The inspection system of claim 6, wherein the processor is configured to calculate an equivalent distance between the X-ray beams generated at a portion of the X-ray source and the surface of the object based on a determination of a relative position of the portion of the X-ray source and a portion of the light-based range finder system. ### Claim 8 (depends on 1) The inspection system of claim 1, wherein the one or more sensors comprises a source of infrared light and a controller configured to determine a time for infrared light scattered from the surface of the object to return to the one or more sensors. ### Claim 9 (depends on 1) The inspection system of claim 1, wherein the processor is configured to modify a color of one or more pixels in the obtained radiographic image based on the determined data representative of the distance. ### Claim 10 (depends on 1) The inspection system of claim 1, wherein the plurality of detectors comprise at least one of a semiconductor material having a wide bandgap, CdTe, CdZnTe, HgI, a semiconductor material having a narrow bandgap, or HPGe. ### Claim 11 (depends on 1) The inspection system of claim 1, wherein the X-ray source is configured to generate a pencil beam and wherein the plurality of detectors is configured to detect X-rays backscattered from the object. ### Claim 12 A method for obtaining a radiographic image of an object located proximate to an inspection system, comprising: using an X-ray source configured to emit X-ray beams; acquiring data representative of the radiographic image of the object using a plurality of detectors; determining, using one or more sensors, data representative of a distance from at least one of the plurality of detectors to an area on a surface of the object; and, processing the obtained radiographic image using a processor, by applying a correction to the obtained radiographic image based on the determined data representative of the distance. ### Claim 13 (depends on 12) The method of claim 12, wherein the correction is a modification of a brightness of the obtained radiographic image based on the determined data representative of the distance. ### Claim 14 (depends on 12) The method of claim 12, wherein the correction is a modification of an intensity of the obtained radiographic image based on the determined data representative of the distance. ### Claim 15 (depends on 14) The method of claim 14, wherein the modification of the intensity of the obtained radiographic image comprises applying an intensity correction to the obtained radiographic image such that the intensity of the obtained radiographic image located at a distance greater than a first predefined distance is reduced by a first predefined factor and the intensity of the obtained radiographic image located at a distance less than a second predefined distance to be increased by a second predefined factor. ### Claim 16 (depends on 12) The method of claim 12, wherein the correction is a geometric correction of the obtained radiographic image to generate an accurate representation of a shape of an object in the obtained radiographic image. ### Claim 17 (depends on 16) The method of claim 16, wherein the one or more sensors comprises a light-based range finder system. ### Claim 18 (depends on 17) The method of claim 17, further comprising calculating, using the processor, an equivalent distance between the X-ray beams generated at a portion of the X-ray source and the surface of the object based on a determination of a relative position of the portion of the X-ray source and a portion of the light-based range finder system. ### Claim 19 (depends on 12) The method of claim 12, wherein the one or more sensors comprises a source of infrared light and a controller configured to determine a time for infrared light scattered from the surface of the object to return to the one or more sensors. ### Claim 20 (depends on 12) The method of claim 12, further comprising modifying, using the processor, a color of one or more pixels in the obtained radiographic image based on the determined data representative of the distance. ### Claim 21 (depends on 12) The method of claim 12, wherein the plurality of detectors comprise at least one of a semiconductor material having a wide bandgap, CdTe, CdZnTe, HgI, a semiconductor material having a narrow bandgap, or HPGe. ### Claim 22 (depends on 12) The method of claim 12, wherein the X-ray source is configured to generate a pencil beam and wherein the plurality of detectors is configured to detect X-rays backscattered from the object.