# US 11,307,321 B2 · Transferring logging data from an offset well location to a target well location > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 11,307,321 B2 - Document ID: US11307321B2 - Status: Granted - Kind: B2 - Application number: 15/780,145 - Filed: 2016-02-12 - Published: 2018-12-13 - Granted: 2022-04-19 - Earliest claimed: 2016-02-12 - Assignees: Landmark Graphics Corporation - Applicants: Landmark Graphics Corporation - Inventors: Xinpu Shen; Guoyang Shen - Web page: https://patentgrep.com/patent/US11307321B2 ## CPC - G01V 1/50: Analysing data - G01V 3/18: specially adapted for well-logging - G01V 3/20: operating with propagation of electric current - G01V 3/38: Processing data, e.g. for analysis, for interpretation, for correction - G01V 11/00: Prospecting or detecting by methods combining techniques covered by two or more of main groups G01V1/00 - G01V9/00 - H10D 1/68: Capacitors having no potential barriers - H10D 8/00: Diodes (variable-capacitance diodes H10D1/64; gated diodes H10D12/00) - H10D 8/01: Manufacture or treatment - H10D 84/204: {of combinations of diodes or capacitors or resistors} - H10D 88/00: Three-dimensional [3D] integrated devices - H10D 89/611: {using diodes as protective elements} - H10W 20/20: Interconnections within wafers or substrates, e.g. through-silicon vias [TSV] - H10W 70/611: {for connecting multiple chips together} - H10W 70/614: {the multiple chips being integrally enclosed} - H10W 70/658: {for devices provided for in groups H10D8/00 - H10D48/00} - H10W 70/685: comprising multiple insulating layers - H10W 70/692: Ceramics or glasses - H10W 70/698: Semiconductor materials that are electrically insulating, e.g. undoped silicon - H10W 90/00: Package configurations - G01V 2200/16: Measure-while-drilling or logging-while-drilling - G01V 2210/6248: Pore pressure - G01V: GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS (means for indicating the location of accidentally buried, e.g. snow-buried, persons A63B29/02) - H10D: INORGANIC ELECTRIC SEMICONDUCTOR DEVICES - H10W: GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10 ## Abstract Systems and methods for transferring logging data from an offset well location to a target well location by adjusting the logging data to account for the difference in correlated depths between the target well and the offset well where logging data is acquired. ## Claims ### Claim 1 A computer-based method for transferring logging data from an offset well location to a target well location, which comprises: measuring true vertical depth (TVD) values for an offset well and a target well respectively; compiling a top-table by correlating each TVD measurement from the offset well with a respective TVD measurement for a predicted trajectory of the target well; calculating a normal compaction trend for the offset well using logging data for the offset well; calculating an inclination of the normal compaction trend using any two TVD measurements from the offset well and the respective logging data at the two TVD measurements; calculating a logging data ratio for the logging data at each respective TVD measurement from the offset well using the inclination, each TVD measurement from the offset well, each correlated TVD measurement for the target well from the top-table and a computer processor; transferring the logging data from the location of the offset well to the location of the target well by multiplying the logging data at each TVD measurement for the offset well by the logging data ratio for each respective TVD measurement from the offset well; and using the logging data transferred to the target well location to predict at least one of overburden stress, effective stress, and pore pressure along the predicted trajectory of the target well. ### Claim 2 (depends on 1) The method of claim 1, wherein each TVD measurement from the offset well corresponds with one of a formation top and a data point at which the logging data was acquired from the offset well. ### Claim 3 (depends on 1) The method of claim 1, wherein the logging data is one of sonic logging data and resistivity logging data. ### Claim 4 (depends on 1) The method of claim 1, wherein the logging data is acquired from the offset well during drilling operations. ### Claim 5 (depends on 1) The method claim 1, wherein the logging data is transferred to the target well location along the predicted trajectory of the target well. ### Claim 6 (depends on 1) The method of claim 1, wherein the inclination of the normal compaction trend is calculated using: C = TVD p ⁢ ⁢ 1 - TVD p ⁢ ⁢ 0 ln ⁡ ( d tcNP ⁢ ⁢ 0 ) - ln ⁡ ( d tcNP ⁢ ⁢ 1 ) where dtcNP0 is the value of the sonic logging data acquired at the offset well location P0 with depth TVDp0 and dtcNP1 is the value of the sonic logging data at the offset well location P1 with depth TVDp1. ### Claim 7 (depends on 6) The method of claim 6, wherein the logging data ratio is calculated using: Rt=e(TVD1−TVD0)/C where TVD0 and TVD1 are the correlated TVD measurements for an offset well and a target well, respectively. ### Claim 8 A non-transitory program carrier device tangibly carrying computer executable instructions for transferring logging data from an offset well location to a target well location, the instructions being executable to implement: measuring true vertical depth (TVD) values for an offset well and a target well respectively; compiling a top-table by correlating each TVD measurement from the offset well with a respective TVD measurement for a predicted trajectory of the target well; calculating a normal compaction trend for the offset well using logging data for the offset well; calculating an inclination of the normal compaction trend using any two TVD measurements from the offset well and the respective logging data at the two TVD measurements; calculating a logging data ratio for the logging data at each respective TVD measurement from the offset well using the inclination, each TVD measurement from the offset well, and each correlated TVD measurement for the target well from the top-table; transferring the logging data from the location of the offset well to the location of the target well by multiplying the logging data at each TVD measurement for the offset well by the logging data ratio for each respective TVD measurement from the offset well; and using the logging data transferred to the target well location to predict at least one of overburden stress, effective stress, and pore pressure along the predicted trajectory of the target well. ### Claim 9 (depends on 8) The program carrier device of claim 8, wherein each TVD measurement from the offset well corresponds with one of a formation top and a data point at which the logging data was acquired from the offset well. ### Claim 10 (depends on 8) The program carrier device of claim 8, wherein the logging data is one of sonic logging data and resistivity logging data. ### Claim 11 (depends on 8) The program carrier device of claim 8, wherein the logging data is acquired from the offset well during drilling operations. ### Claim 12 (depends on 8) The program carrier device claim 8, wherein the logging data is transferred to the target well location along the predicted trajectory of the target well. ### Claim 13 (depends on 8) The program carrier device of claim 8, wherein the inclination of the normal compaction trend is calculated using: C = TVD p ⁢ ⁢ 1 - TVD p ⁢ ⁢ 0 ln ⁡ ( d tcNP ⁢ ⁢ 0 ) - ln ⁡ ( d tcNP ⁢ ⁢ 1 ) where dtcNP0 is the value of the sonic logging data acquired at the offset well location P0 with depth TVDp0 and dtcNP1 is the value of the sonic logging data at the offset well location P1 with depth TVDp1. ### Claim 14 (depends on 13) The program carrier device of claim 13, wherein the logging data ratio is calculated using: Rt=e(TVD1−TVD0)/C where TVD0 and TVD1 are the correlated TVD measurements for an offset well and a target well, respectively. ### Claim 15 A non-transitory program carrier device tangibly carrying computer executable instructions for transferring logging data from an offset well location to a target well location, the instructions being executable to implement: measuring true vertical depth (TVD) values for an offset well and a target well respectively; compiling a top-table by correlating each TVD measurement from the offset well with a respective TVD measurement for a predicted trajectory of the target well; calculating an inclination of a normal compaction trend for the offset well using any two TVD measurements from the offset well and respective logging data for the offset well at the two TVD measurements; calculating a logging data ratio for the logging data at each respective TVD measurement from the offset well using the inclination, each TVD measurement from the offset well, and each correlated TVD measurement for the target well from the top-table; transferring the logging data from the location of the offset well to the location of the target well by multiplying the logging data at each TVD measurement for the offset well by the logging data ratio for each respective TVD measurement from the offset well; and using the logging data transferred to the target well location to predict at least one of overburden stress, effective stress, and pore pressure along the predicted trajectory of the target well. ### Claim 16 (depends on 15) The program carrier device of claim 15, wherein the inclination of the normal compaction trend is calculated using: C = TVD p ⁢ ⁢ 1 - TVD p ⁢ ⁢ 0 ln ⁡ ( d tcNP ⁢ ⁢ 0 ) - ln ⁡ ( d tcNP ⁢ ⁢ 1 ) where dtcNP0 is the value of the sonic logging data acquired at the offset well location P0 with depth TVDp0 and dtcNP1 is the value of the sonic logging data at the offset well location P1 with depth TVDp1. ### Claim 17 (depends on 16) The program carrier device of claim 16, wherein the logging data ratio is calculated using: Rt=e(TVD1−TVD0)/C where TVD0 and TVD1 are the correlated TVD measurements for an offset well and a target well, respectively. ### Claim 18 (depends on 15) The program carrier device of claim 15, wherein each TVD measurement from the offset well corresponds with one of a formation top and a data point at which the logging data was acquired from the offset well.