# US 11,307,251 B1 · Circuit and testing circuit thereof

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- Number: US 11,307,251 B1
- Document ID: US11307251B1
- Status: Granted
- Kind: B1
- Application number: 17/084,660
- Filed: 2020-10-30
- Published: 2022-03-31
- Granted: 2022-04-19
- Earliest claimed: 2020-09-30
- Assignees: Shanghai Zhaoxin Semiconductor Co., Ltd.
- Applicants: Shanghai Zhaoxin Semiconductor Co., Ltd.
- Inventors: Yunhao Xing
- Web page: https://patentgrep.com/patent/US11307251B1

## CPC

- G01R 31/318552: {Clock circuits details}
- G01R 31/31853: {Test of registers}
- G01R 31/318536: {Scan chain arrangements, e.g. connections, test bus, analog signals}
- G01R 31/318555: {Control logic}
- G01R 31/318558: {Addressing or selecting of subparts of the device under test}
- G01R 31/318572: {Input/Output interfaces}
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

A circuit, including a TAP circuit, a routing circuit, a first test path and a second test path, is provided. A first input terminal and a first output terminal of the routing circuit are respectively coupled to a scan output terminal and a first scan input terminal of the TAP circuit. A first terminal of the first test path is coupled to a second input terminal of the routing circuit. A second terminal of the first test path is coupled to a second output terminal of the routing circuit. A first terminal of the second test path is coupled to a third input terminal of the routing circuit. A second terminal of the second test path is coupled to a third output terminal of the routing circuit. The routing circuit couples the scan output terminal of the TAP circuit to the first scan input terminal of the TAP circuit or the first terminal of the first test path or the first terminal of the second test path.

## Claims

### Claim 1

A circuit, comprising:
a test access port circuit, comprising a first scan input terminal and a scan output terminal;
a routing circuit, comprising a first input terminal, a first output terminal, a second input terminal, a second output terminal, a third input terminal and a third output terminal, wherein said first input terminal and said first output terminal of said routing circuit are respectively coupled to said scan output terminal and said first scan input terminal of said test access port circuit;
a first test path, comprising a first terminal and a second terminal, wherein said first terminal of said first test path is coupled to said second input terminal of said routing circuit, said second terminal of said first test path is coupled to said second output terminal of said routing circuit; and
a second test path, comprising a first terminal and a second terminal, wherein said first terminal of said second test path is coupled to said third input terminal of said routing circuit, and said second terminal of said second test path is coupled to said third output terminal of said routing circuit,
wherein said routing circuit couples said scan output terminal of said test access port circuit to said first scan input terminal of said test access port circuit or said first terminal of said first test path or said first terminal of said second test path.

### Claim 2 (depends on 1)

The circuit according to claim 1, wherein in a serial connection scan mode, said routing circuit connects said first test path and said second test path in series, couples said scan output terminal of said test access port circuit to said first terminal of said second test path, and couples said first scan input terminal of said test access port circuit to said second terminal of said first test path.

### Claim 3 (depends on 1)

The circuit according to claim 1, wherein in a partial scan mode, said routing circuit couples said scan output terminal of said test access port circuit to said first terminal of said first test path, couples said first scan input terminal of said test access port circuit to said second terminal of said first test path, and cut off a connection between said second test path and said test access port circuit.

### Claim 4 (depends on 1)

The circuit according to claim 1, wherein said routing circuit comprises:
a first switching circuit, comprising a first input terminal, a second input terminal and an output terminal, wherein said first input terminal or said second input terminal of said first switching circuit is electrically connected to said output terminal of said first switching circuit; and
a second switching circuit, comprising a first input terminal, a second input terminal, and an output terminal, wherein said first input terminal or said second input terminal of said second switching circuit is electrically connected to said output terminal of said second switching circuit,
wherein said first input terminal of said first switching circuit is coupled to said scan output terminal of said test access port circuit and said first terminal of said first test path, said second input terminal of said first switching circuit is coupled to said second terminal of said first test path, and said output terminal of said first switching circuit is coupled to said first terminal of said second test path, and
wherein said first input terminal of said second switching circuit is coupled to said output terminal of said first switching circuit, said second input terminal of said second switching circuit is coupled to said second terminal of said second test path, and said output terminal of said second switching circuit is coupled to said first scan input terminal of said test access port circuit.

### Claim 5 (depends on 1)

The circuit according to claim 1, wherein said routing circuit comprises:
a first switching circuit, comprising a first input terminal, a second input terminal and an output terminal, wherein said first input terminal or said second input terminal of said first switching circuit is electrically connected to said output terminal of said first switching circuit;
a second switching circuit, comprising a first input terminal, a second input terminal and an output terminal, wherein said first input terminal or said second input terminal of said second switching circuit is electrically connected to said output terminal of said second switching circuit, and
a third switching circuit, comprising a first input terminal, a second input terminal and an output terminal, wherein said first input terminal or said second input terminal of said third switching circuit is electrically connected to said output terminal of said third switching circuit,
wherein said first input terminal of said first switching circuit is coupled to said scan output terminal of said test access port circuit and said first terminal of said first test path, said second input terminal of said first switching circuit is coupled to said second terminal of said first test path, and said output terminal of said first switching circuit is coupled to said first terminal of said second test path,
wherein said first input terminal of said second switching circuit is coupled to said output terminal of said first switching circuit, said second input terminal of said second switching circuit is coupled to said second terminal of said second test path, said output terminal of said second switching circuit is coupled to said second input terminal of said third switching circuit, said first input terminal of said third switching circuit is coupled to said scan output terminal of said test access port circuit, and said output terminal of said third switching circuit is coupled to said first scan input terminal of said test access port circuit.

### Claim 6 (depends on 5)

The circuit according to claim 5, wherein any one of said first switching circuit, said second switching circuit, and said third switching circuit is a segment insertion bit element.

### Claim 7 (depends on 1)

The circuit according to claim 1, further comprising:
a clock supply circuit, wherein in a shift operation mode, said clock supply circuit provides a shift clock signal to said first test path and said second test path, and wherein in a capture operation mode, said clock supply circuit provides a first clock signal to said first test path and provides a second clock signal to said second test path.

### Claim 8 (depends on 7)

The circuit according to claim 7, wherein said clock supply circuit comprises:
a clock generation circuit, to generate said first clock signal and said second clock signal with different phases;
a first selector, comprising a first input terminal, a second input terminal, a control terminal and an output terminal, wherein said first input terminal of said first selector is coupled to said clock generation circuit to receive said first clock signal, said second input terminal of said first selector receives said shift clock signal, said first selector provides said shift clock signal to said first test path in said shift operation mode, and provides said first clock signal to said first test path in said capture operation mode; and
a second selector, comprising a first input terminal, a second input terminal, a control terminal and an output terminal, wherein said first input terminal of said second selector is coupled to said clock generation circuit to receive said second clock signal, said second input terminal of said second selector receives said shift clock signal, said second selector provides said shift clock signal to said second test path in said shift operation mode, and provides said second clock signal to said second test path in said capture operation mode.

### Claim 9 (depends on 8)

The circuit according to claim 8, wherein said clock supply circuit further comprises:
a logic gate, coupled to said second input terminal of said first selector and said second input terminal of said second selector to provide said shift clock signal to said first selector and said second selector.

### Claim 10 (depends on 8)

The circuit according to claim 8, wherein said clock generation circuit comprises:
a switching circuit, comprising a first input terminal, a second input terminal and an output terminal, wherein said first input terminal of said switching circuit is coupled to said scan output terminal of said test access port circuit, said output terminal of said switching circuit is coupled to a second scan input terminal of said test access port circuit;
a first register, comprising an input terminal and an output terminal, wherein said input terminal of said first register is coupled to said scan output terminal of said test access port circuit, said output terminal of said first register is coupled to said first input terminal of said first selector to provide said first clock signal;
a second register, comprising an input terminal and an output terminal, wherein said input terminal of said second register is coupled to said output terminal of said first register and said output terminal of said second register is coupled to said first input terminal of said second selector to provide said second clock signal; and
a third register, comprising an input terminal and an output terminal, wherein said input terminal of said third register is coupled to said output terminal of said second register, said output terminal of said third register is coupled to said second input terminal of said switching circuit, said control terminal of said first selector and said control terminal of said second selector to provide a scan enable signal, wherein
when said scan enable signal is at a first logic state, said circuit works in said shift operation mode,
when said scan enable signal is at a second logic state, said circuit works in said capture operation mode.

### Claim 11

A testing circuit of a circuit, comprising:
a test access port circuit, wherein a scan output terminal of said test access port circuit is coupled to a first terminal of a first test path of said circuit, a second terminal of said first test path is coupled to a first terminal of a second test path of said circuit, and a second terminal of said second test path is coupled to a first scan input terminal of said test access port circuit; and
a clock supply circuit, wherein in a shift operation mode, said clock supply circuit provides a shift clock signal to said first test path and said second test path, and in a capture operation mode, said clock supply circuit provides a first clock signal to said first test path, provides a second clock signal to said second test path.

### Claim 12 (depends on 11)

The testing circuit according to claim 11, wherein said clock supply circuit comprises:
a clock generation circuit, to generate said first clock signal and said second clock signal with different phases;
a first selector, comprising a first input terminal, a second input terminal, a control terminal and an output terminal, wherein said first input terminal of said first selector is coupled to said clock generation circuit to receive said first clock signal, said second input terminal of said first selector receives said shift clock signal, said first selector provides said shift clock signal to said first test path in said shift operation mode, and provides said first clock signal to said first test path in said capture operation mode; and
a second selector, comprising a first input terminal, a second input terminal, a control terminal and an output terminal, wherein said first input terminal of said second selector is coupled to said clock generation circuit to receive said second clock signal, said second input terminal of said second selector receives said shift clock signal, said second selector provides said shift clock signal to said second test path in said shift operation mode, and provides said second clock signal to said second test path in said capture operation mode.

### Claim 13 (depends on 12)

The testing circuit according to claim 12, wherein said clock supply circuit further comprises:
a logic gate, coupled to said second input terminal of said first selector and said second input terminal of said second selector to provide said shift clock signal to said first selector and said second selector.

### Claim 14 (depends on 12)

The testing circuit according to claim 12, wherein said clock generation circuit comprises:
a switching circuit, comprising a first input terminal, a second input terminal and an output terminal, wherein said first input terminal of said switching circuit is coupled to said scan output terminal of said test access port circuit, said output terminal of said switching circuit is coupled to a second scan input terminal of said test access port circuit;
a first register, comprising an input terminal and an output terminal, wherein said input terminal of said first register is coupled to said scan output terminal of said test access port circuit, said output terminal of said first register is coupled to said first input terminal of said first selector to provide said first clock signal;
a second register, comprising an input terminal and an output terminal, wherein said input terminal of said second register is coupled to said output terminal of said first register, said output terminal of said second register is coupled to said first input terminal of said second selector to provide said second clock signal; and
a third register, comprising an input terminal and an output terminal, wherein said input terminal of said third register is coupled to said output terminal of said second register, said output terminal of said third register is coupled to said second input terminal of said switching circuit, said control terminal of said first selector and said control terminal of said second selector to provide a scan enable signal, wherein
when said scan enable signal is at a first logic state, said circuit works in said shift operation mode,
when said scan enable signal is at a second logic state, said circuit works in said capture operation mode.