# US 11,307,232 B1 · Waveguide integrated circuit testing > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 11,307,232 B1 - Document ID: US11307232B1 - Status: Granted - Kind: B1 - Application number: 16/796,517 - Filed: 2020-02-20 - Granted: 2022-04-19 - Earliest claimed: 2019-02-26 - Assignees: Johnstech International Corporation - Applicants: Johnstech International Corporation - Inventors: Jeffrey Sherry; Cory Kostuchowski - Web page: https://patentgrep.com/patent/US11307232B1 ## CPC - G01R 29/0878: {Sensors; antennas; probes; detectors (wave guide measuring sections G01R1/24)} - G01R 1/045: {Sockets or component fixtures for RF or HF testing} - G01R 1/06772: {High frequency probes} - G01R 1/07: Non contact-making probes - G01R 31/265: Contactless testing {(of circuits, also in wafer-form G01R31/302)} - G01R 31/303: of integrated circuits (G01R31/305 - G01R31/315 take precedence) - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract A structure and method for providing a housing which includes a high frequency (HF or RF) connection between a device under test (DUT) having a waveguide 22. The waveguide includes a wave insert 22, and a conductive compliant member 40 which maintains bias between the adapter/insert 22 and the DUT HF port 20 while also maintaining an RF shield despite the variable height of the DUT waveport. A passage 50 provides an RF connection between the RF port 62 on the DUT and a RF wave guide horn 54. A plurality of transmitting horns 54 can be arranged to transmit to a single receiving horn 154 so that fewer receivers are required to test multiple DUTs in sequence. ## Claims ### Claim 1 A system for testing multiple integrated circuit devices under test (DUT) having a radio high frequency (RF) wave port located on the DUT, comprising: a. an array of test housings each having a receiver for a DUT, said housing being arranged around a central axis; b. each housing being associated with a RF transmitting horn antenna having narrow proximal central aperture and a wide distal aperture and defining a transmitter horn axis therebetween; c. an interface adapter element having a first end located proximate said DUT RF wave port and a second end; d. a receiving RF horn antenna located generally above said array, adjacent said second end of said interface adapter and proximate said central axis; e. said RF transmitting horn antennas being oriented so that the horn axis generally points to said receiving horn where the transmitting axis intersects said central axis. ### Claim 2 (depends on 1) The system of claim 1 wherein said DUT has a RF port having a port central axis and wherein said central aperture on said horn antenna is coaxially aligned with said port central axis. ### Claim 3 (depends on 1) The system of claim 1 further including a waveguide insert supported by a compliant elastic member, said insert being interposed between said DUT RF port and said horn antenna which thereby causes the insert to minimize RF leakage between the DUT RF port and antenna. ### Claim 4 (depends on 3) The system of claim 3 wherein said elastic member is at least partially recessed with said housing. ### Claim 5 (depends on 4) The system of claim 4 wherein said housing includes a groove sized to receive a portion of said elastic member. ### Claim 6 (depends on 1) The system of claim 1 wherein said DUT, housing and transmitting antenna are enclosed in an environmentally controlled enclosure. ### Claim 7 (depends on 6) The system of claim 6 further including at least one receiving antenna and wherein said receiving antenna is located outside said enclosure. ### Claim 8 (depends on 1) The system of claim 1 further including at least one receiving antenna and wherein said receiving antenna is located generally along said central axis spaced from said transmitting antenna. ### Claim 9 (depends on 8) The system of claim 8 wherein said transmitting antenna includes a plurality of transmitting antennas, one associated with each DUT and wherein each transmitting antenna is pointed to said receiving antenna. ### Claim 10 (depends on 9) The system of claim 9 wherein said receiving antenna sequentially tests a plurality of DUTs. ### Claim 11 (depends on 9) The system of claim 9 wherein said transmitting antennas are each angled toward said receiving antenna. ### Claim 12 (depends on 1) The system of claim 1 wherein said interface adapter is biased against said RF port. ### Claim 13 (depends on 1) The system of claim 1 wherein said interface adapter includes vertical pints and is configured to move along said pins. ### Claim 14 A test apparatus for testing multiple integrated circuit devices under test (DUT) having a radio high frequency (RF) wave port located on the DUT, comprising: f. an array of test housings each having a receiver for a DUT, said housing being arranged around a central axis; g. each housing being associated with a RF transmitting horn antenna having proximal central aperture and a wider distal aperture and defining a transmitter horn axis therebetween; h. a circumferential adapter element size to surround said DUT RF port having a first end located proximate said RF wave port and having a bias element to maintain engagement between said RF port and said adapter; i. a receiving RF horn antenna located generally above said array and proximate said central axis and said adapter; j. said RF transmitting horn antennas being oriented so that the horn axis generally points to said receiving horn where the transmitting axis intersects said central axis. ### Claim 15 A method of testing a plurality of radio frequency transmitting devices under test (DUT), each DUT having a RF output port, comprising the steps of: a. locating a plurality of DUTs in an array with each RF output port being oriented in the same direction; b. locating a transmitting RF waveguide horn proximate the DUT output port on DUT; c. locating a receiving wave guide horn proximate the array but spaced therefrom and generally central to the array; d. pointing the transmitting RF waveguide horns in the array at an angle toward the receiving horn; e. sequentially testing each of DUTs in the array and sequentially receiving RF signals from each of said DUTs at said receiving horn. ### Claim 16 (depends on 15) The method of claim 15 further including the step of pointing each of said horns toward said receiving horn. ### Claim 17 (depends on 15) The method of claim 15 further including locating an adapter element between said RF port and said RF waveguide to create an RF shield therebetween. ### Claim 18 (depends on 17) The method of claim 17 further including locating an elastomeric bias member adjacent the adapter element to maintain said element in contact with said RF waveguide and minimize RF crosstalk. ### Claim 19 (depends on 15) The method of claim 15 further including the step of locating the DUT and wave guide horn within an environmentally enclosed chamber and locating said receiving horn outside said chamber.