# US 11,307,160 B2 · Quality detection device, quality detection method, and integrated probe assembly

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- Number: US 11,307,160 B2
- Document ID: US11307160B2
- Status: Granted
- Kind: B2
- Application number: 16/854,917
- Filed: 2020-04-22
- Published: 2020-08-06
- Granted: 2022-04-19
- Earliest claimed: 2018-11-02
- Assignees: Han's Laser Technology Industry Group Co., Ltd.
- Applicants: Han's Laser Technology Industry Group Co., Ltd
- Inventors: Sheng Lin Wang; Hao Liu; Da Chang Hu; Yong Hu; Peng Fei Lei; Ji Guo Liu; Zuo Bin Xu; Yun Feng Gao
- Web page: https://patentgrep.com/patent/US11307160B2

## CPC

- G01N 27/20: Investigating the presence of flaws
- G01N 27/041: {of a solid body}
- G01N 33/207: Welded or soldered joints; Solderability
- G01R 1/073: Multiple probes
- G01R 27/02: Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant (by measuring phase angle only G01R25/00)
- G05B 19/05: Programmable logic controllers, e.g. simulating logic interconnections of signals according to ladder diagrams or function charts
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)
- G05B: CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS (systems for controlling or regulating non-electric variables G05D; systems for regulating electric or magnetic variables G05F; control devices or systems insofar as characterised by mechanical features only G05G)

## Abstract

The present disclosure relates to a welding quality detecting field, and specifically relates to a quality detection device. The quality detection device includes an integrated probe set, a driving module and a collecting module. The integrated probe set includes a plurality of integrated probe assemblies. The integrated probe assemblies are disposed in pairs and each integrated probe assembly includes a driving end and a collecting end. The driving end of one integrated probe assembly is matched with the driving end of another integrated probe assembly disposed in pairs with the one integrated probe assembly. The collecting end of one integrated probe assembly is matched with the collecting end of another integrated probe assembly disposed in pairs with the one integrated probe assembly.

## Claims

### Claim 1

A quality detection device, comprising an integrated probe set, a driving module, and a collecting module; wherein the integrated probe set comprises a plurality of integrated probe assemblies; the integrated probe assemblies are disposed in pairs and each of the integrated probe assemblies comprises a driving end and a collecting end; the driving end of one integrated probe assembly is matched with the driving end of another integrated probe assembly disposed in pairs with the one integrated probe assembly; the collecting end of one integrated probe assembly is matched with the collecting end of another integrated probe assembly disposed in pairs with the one integrated probe assembly; the driving module releases current to form a current loop with a conductor by driving both of the driving ends of the one integrated probe assembly and the another integrated probe assembly, where the driving ends abut against the conductor; the collecting module obtains a resistance value of an area of the current loop formed in the conductor, where the collecting ends abut against the conductor;
wherein the integrated probe assemblies comprise a first probe disposed on an outer side of the integrated probe assemblies and a second probe disposed in an inner side of the integrated probe assemblies; an end face of the first probe and an end face of the second probe are disposed in a same level when the integrated probe assemblies abut against the conductor; wherein the first probe is one of the driving end and the collecting end; and the second probe is the other one of the driving end and the collecting end;
wherein the quality detection device further comprises a moving assembly configured to fix the integrated probe assemblies; the moving assembly is connected with a support or the conductor to realize relative movement of the support and the conductor; the support comprises fixing ends disposed in two rows, the fixing ends respectively fix the corresponding integrated probe assemblies; and the moving assembly drives the support to move such that the integrated probe assemblies disposed in pairs abut against two sides of a welded seam of the corresponding conductor;
wherein the quality detection device comprises a workbench, a conductor clamping end disposed on a center of the workbench, and the support is disposed on two sides of the workbench; the moving assembly is disposed between the workbench and the support to drive the support to move inwards or outwards along the workbench.

### Claim 2 (depends on 1)

The quality detection device according to claim 1, wherein the integrated probe assemblies are disposed in two rows; the integrated probe assemblies in one row are disposed in pairs with the integrated probe assemblies in the other row.

### Claim 3 (depends on 1)

The quality detection device according to claim 1, wherein an end-part groove is disposed on the first probe and the second probe is disposed in the end-part groove.

### Claim 4 (depends on 1)

The quality detection device according to claim 1, wherein the first probe is of an annular tubular structure and the second probe is disposed in a hollow structure of the first probe.

### Claim 5 (depends on 1)

The quality detection device according to claim 1, wherein the quality detection device further comprises an integrated circuit with a plurality of switching modules; the matched driving ends and collecting ends are respectively connected to the driving module and the collecting module by a switching module; the integrated circuit sequentially turns on the switching module and enables the driving module to release current to form the current loop with the conductor by the driving ends where the driving ends abut against the conductor; and the collecting module obtains the resistance value of the area of the current loop formed in the conductor, where the collecting ends abut against the conductor.

### Claim 6 (depends on 5)

The quality detection device according to claim 5, wherein the integrated circuit comprises a programmable logic controller (PLC) module configured to transmit data and relays forming the switching modules; the PLC module is respectively connected with the driving module, the collecting module, and a plurality of relays; each relay is connected with two driving ends and two collecting ends, and the two driving ends are disposed in pairs with and the two collecting ends.

### Claim 7 (depends on 1)

The quality detection device according to claim 1, wherein the driving module and the collecting module are integrated into a micro resistance meter; the micro resistance meter comprises a driving system and a collecting system; the driving system is configured to output current and connect with the driving module; and the collecting system is configured to collect electrical information and connects with the collecting module.

### Claim 8

A quality detecting method based on a welded seam, comprising steps:
respectively abutting integrated probe assemblies in pairs against two sides of a welded seam on a conductor, wherein the integrated probe assemblies are disposed in pairs and each of the integrated probe assemblies comprises a driving end and a collecting end, the driving end of one integrated probe assembly is matched with the driving end of another integrated probe assembly disposed in pairs with the one integrated probe assembly; and the collecting end of one integrated probe assembly is matched with the collecting end of another integrated probe assembly disposed in pairs with the one integrated probe assembly;
releasing a current to form a current loop between a conductor and the driving ends abutting against the conductor;
abutting collecting ends against the conductor, obtaining an electrical information of an area of the current loop formed in the conductor, and forming a plurality of scanning channels; and
converting the collected electrical information into a resistance value and obtaining quality of the welded seam;
wherein step of determining the quality of the welded seam comprises:
pre-determining a first ratio interval, a second ratio interval and a third ratio interval, where the first ratio interval, the second ratio interval, and the third ratio interval are sorted by ascending values;
calculating a ratio of an obtained resistance value and a resistance value of the conductor itself; and
if the ratio is in the first ratio interval, the welded seam is considered to be qualified; if the ratio is in the second ratio interval, the welded seam is considered to be false welding; if the ratio is in the third ratio interval, the welded seam is considered to be poor welding.

### Claim 9 (depends on 8)

The quality detecting method according to claim 8, wherein the steps of the quality detecting method further comprise:
collecting a voltage value of the area of the current loop corresponding to the collecting end by the collecting end and obtaining a resistance value of a position corresponding to the area of the current loop according to an electrified current value; and
determining whether the resistance value is abnormal or not, if the resistance value is normal, the welded seam is considered to be qualified, otherwise the welded seam is considered to be defective.