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US 11,307,097 B1Granted
Technologies for high resolution and wide swath spectrometer
AssigneeABB Schweiz AG
InventorsFlorent M. Prel, Frederic J. Grandmont, Louis M. Moreau, Eric A. Carbonneau, Martin C. Larouche
Life of this patent
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Abstract
Technologies for a high resolution and wide swath spectrometer are disclosed. In the illustrative embodiment, an inverted image slicer converts a linear field of view into a grid shape, allowing for an interferometer of a Fourier transform spectrometer to operate on a narrow range of field of views, improving the average spectral resolution of the spectrometer.
Claims20
A spectrometer comprising:
- an inverted image slicer configured to accept input light to the spectrometer;
- an adjustable interferometer configured to accept light from the inverted image slicer;
- a sensor configured to sense light from the interferometer;
- wherein the inverted image slicer causes a linear field of view of the spectrometer to be imaged as a two-dimensional grid on the sensor.
1 more element
A method of using a spectrometer, the method comprising:
- gathering light into an inverted image slicer, the inverted image slicer configured to accept input light to the spectrometer;
- transmitting light from the inverted image slicer to an adjustable interferometer;
- and
- detecting light from the adjustable interferometer at a sensor,
- wherein the inverted image slicer causes a linear field of view of the spectrometer to be imaged as a two-dimensional grid on the sensor.
2 more elements
Dependencies are inferred from the claim text.