Measurement system and method thereof
AssigneeOMRON Corporation
InventorsYuta Suzuki, Hiroshi Sawaragi, Tomonori Kondo
Life of this patent
Estimating the term…
Loading patent…
AssigneeOMRON Corporation
InventorsYuta Suzuki, Hiroshi Sawaragi, Tomonori Kondo
Estimating the term…
A measurement system and method, which increases a degree of freedom for setting a measurement period and a transmission period of measurement values and has a high accuracy, are provided. The measurement system includes a control device and a measurement device that measures a measurement object in a first period and transmits measurement values obtained from the measurement device to the control device. The measurement device transmits the measurement values waiting to be transmitted and additional information including information of the number of the measurement values waiting to be transmitted to the control device using frames transmitted in a second period that is longer than the first period. The control device generates time series data in which the measurement values are arranged in time series using the additional information.
A measurement system, comprising:
A method for a measurement system, including a control device comprising a processor;
Dependencies are inferred from the claim text.