# US 11,260,532 B2 · Calibration method for robot arm and calibration device thereof

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- Number: US 11,260,532 B2
- Document ID: US11260532B2
- Status: Granted
- Kind: B2
- Application number: 16/571,492
- Filed: 2019-09-16
- Published: 2020-09-24
- Granted: 2022-03-01
- Earliest claimed: 2019-03-20
- Assignees: Delta Electronics, Inc.
- Applicants: Delta Electronics, Inc.
- Inventors: Yuan-Kun Hsiao; Jian-Jang Lai; Ko-Yueh Chen
- Web page: https://patentgrep.com/patent/US11260532B2

## CPC

- B25J 9/1692: {Calibration of manipulator}
- B25J 9/1697: {Vision controlled systems}
- B25J 19/0095: {Means or methods for testing manipulators}
- G01B 21/042: {Calibration or calibration artifacts (G01B3/30, G01B9/02072 take precedence)}
- G05B 2219/39016: Simultaneous calibration of manipulator and camera
- G05B 2219/39024: Calibration of manipulator
- G05B 2219/39025: Spheric tool interrupts transmitted calibration beam, in different configurations
- G05B 2219/39045: Camera on end effector detects reference pattern
- G05B 2219/39057: Hand eye calibration, eye, camera on hand, end effector
- B25J: MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES ({manipulators specially adapted for use in surgery A61B34/70; manipulators used in cleaning hollow articles B08B9/04}; manipulators associated with rolling mills B21B39/20; manipulators associated with forging machines B21J13/10; {manipulators associated with picking-up and placing mechanisms B23P19/007}; means for holding wheels or parts thereof B60B30/00; {vehicles with ground-engaging propulsion means, e.g. walking members B62D57/02, B62D57/032; devices for picking-up and depositing articles or materials between conveyors B65G47/90, B65G47/91; manipulators with gripping or holding means for transferring packages B65H67/065}; cranes B66C; {manipulators used in the protection or supervision of pipe-line installations F17D5/00; walking equipment adapted for nuclear steam-generators F22B37/006}; manipulators specially adapted for, or associated with, nuclear reactors G21C; {apparatus used for handling wafers during manufacture or treatment of semiconductor H10P72/50})
- G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G05B: CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS (systems for controlling or regulating non-electric variables G05D; systems for regulating electric or magnetic variables G05F; control devices or systems insofar as characterised by mechanical features only G05G)

## Abstract

A calibration device is provided. The calibration device includes a frame, a first optical sensing device, a second optical sensing device and a third optical sensing device. The frame includes a bottom plate and at least four sidewalls, wherein the sidewalls have a first grating hole, a second grating hole, a third grating hole and a fourth grating hole at a first height. The bottom plate has an image recognition pattern, a first measurement point, a second measurement point and a third measurement point.

## Claims

### Claim 1

A calibration device, comprising:
a frame, comprising a bottom plate and at least four sidewalls, wherein there are a first grating hole, a second grating hole, a third grating hole and a fourth grating hole at a first height on the sidewalls, and an image recognition pattern, a first measurement point, a second measurement point and a third measurement point on the bottom plate;
a first optical sensing device, comprising a first light-emitting unit disposed on one of the sidewalls of the frame and configured to provide a first light, and a first receiving unit disposed on a sidewall corresponding to the sidewall on which the first light-emitting unit is disposed and configured to receive the first light;
a second optical sensing device, comprising a second light-emitting unit disposed on one of the sidewalls of the frame and configured to provide a second light, and a second receiving unit disposed on a sidewall corresponding to the sidewall on which the second light-emitting unit is disposed and configured to receive the second light; and
a third optical sensing device, comprising a third light-emitting unit disposed on one of the sidewalls of the frame and configured to provide a third light, and a third receiving unit disposed on a sidewall corresponding to the sidewall on which the third light-emitting unit is disposed and configured to receive the third light.

### Claim 2 (depends on 1)

The calibration device as claimed in claim 1, wherein the first grating hole faces the second grating hole, and the third grating hole faces the fourth grating hole.

### Claim 3 (depends on 1)

The calibration device as claimed in claim 1, further comprising a fifth grating hole and a sixth grating hole, wherein the fifth grating hole and the sixth grating hole are located on the sidewalls at a second height, and the fifth grating hole is parallel to the sixth grating hole, and faces the sixth grating hole.

### Claim 4 (depends on 3)

The calibration device as claimed in claim 3, wherein the second height is higher than the first height.

### Claim 5 (depends on 2)

The calibration device as claimed in claim 2, wherein the first light is configured to pass through the first grating hole, and to be received by the first receiving unit via the second grating hole.

### Claim 6 (depends on 2)

The calibration device as claimed in claim 2, wherein the second light is configured to pass through the third grating hole, and to be received by the second receiving unit via the fourth grating hole.

### Claim 7 (depends on 3)

The calibration device as claimed in claim 3, wherein the third light is configured to pass through the fifth grating hole, and to be received by the third receiving unit via the sixth grating hole.

### Claim 8 (depends on 4)

The calibration device as claimed in claim 4, wherein the first optical sensing device and the second optical sensing device are disposed at the first height of the sidewalls, and the third optical sensing device is disposed at the second height of the sidewalls.

### Claim 9 (depends on 1)

The calibration device as claimed in claim 1, wherein the first light and the second light are on a first plane at the first height, the third light is on a second plane at the second height, the first plane is parallel to the second plane, the first plane is parallel to the image recognition pattern, and the first light and the second light intersect to form a light intersection point.

### Claim 10

A calibration method for a robot arm, comprising:
providing a robot arm with an end point of reference, a connection stage and an image capturing device, wherein the image capturing device is disposed on the connection stage;
providing a machine tool disposed on the connection stage;
providing a calibration device comprising an image recognition pattern, a first measurement point, a second measurement point and a third measurement point;
capturing images of the image recognition pattern, the first measurement point, the second measurement point and the third measurement point, wherein a first transfer matrix of the image capturing device relative to the end point of reference is calculated according to the image recognition pattern, and actual coordinates of the image capturing device relative to the end point of reference are obtained; and
obtaining a second transfer matrix of the first measurement point, the second measurement point and the third measurement point relative to the end point of reference from measured size values of the images of the first measurement point, the second measurement point and the third measurement point, and actual size values of the images of the first measurement point, the second measurement point and the third measurement point.

### Claim 11 (depends on 10)

The calibration method as claimed in claim 10, wherein the calibration device further comprises a first optical sensing device, a second optical sensing device and a third optical sensing device, wherein the first optical sensing device comprises a first light-emitting unit configured to provide a first light, and a first receiving unit configured to receive the first light, the second optical sensing device comprises a second light-emitting unit and a second light-receiving unit, the second light-emitting unit provides a second light, and the second light-receiving unit receives the second light, the third optical sensing device comprises a third light-emitting unit and a third light-receiving unit, the third light-emitting unit is provides a third light, and the third light-receiving unit receives the third light.

### Claim 12 (depends on 11)

The calibration method as claimed in claim 11, wherein the first light and the second light are on a first plane at a first height, the third light is on a second plane at a second height, the first plane is parallel to the second plane, the first plane is parallel to the image recognition pattern, and the first light and the second light form a light intersection point.

### Claim 13 (depends on 12)

The calibration method as claimed in claim 12, further comprising:
calculating coordinates of the light intersection point relative to the end point of reference via the second transfer matrix.

### Claim 14 (depends on 13)

The calibration method as claimed in claim 13, further comprising:
the robot arm puts the machine tool in the calibration device, wherein the an end of the machine tool is moved to the light intersection point according to blocking information of the first light, the second light and the third light, and a calibration process is completed automatically by calculating actual coordinates of the end of the machine tool relative to the end point of reference from a base coordinate of the light intersection point relative to the end point of reference.
