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US 11,255,990 B2Granted
Internal structure detection system
AssigneeHitachi, Ltd.
InventorsAkira Maeki, Shiro Mazawa, Tatsuyuki Saito, Takao Sakurai, Tomonori Sekiguchi
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Abstract
An internal structure detection system includes: two kinds of sensors with different operating principles for receiving reflected waves of vibration applied to an inspection target in an investigation area; and a processing apparatus that detects an internal structure of the inspection target by using the sensor data received by the two kinds of sensors. The two kinds of sensors are deployed in the investigation area with different densities, in a distributed manner.
Claims11
An internal structure detection system comprising:
- two kinds of sensors with different operating principles for receiving reflected waves of vibration applied to an inspection target in an investigation area;
- and
- a processing apparatus that detects an internal structure of the inspection target by using the sensor data received by the two kinds of sensors,
- wherein the two kinds of sensors are deployed in the investigation area with different densities, in a distributed manner,
- wherein the processing apparatus comprises a storage unit storing sensor information including noise spectral density for each sensor used for inspecting interior of the investigation area, the sensor information being associated with unique identification information of the sensor, and
- wherein the sensor information is associated with validity coefficients representing which frequency bands of the sensor data obtained by the corresponding sensor are valid, the validity coefficients reflecting a result of inspecting the corresponding sensor at predetermined intervals.
3 more elements
Dependencies are inferred from the claim text.