Electron microscope
AssigneeHitachi High-Tech Corporation
InventorsTakashi Ohshima, Hiroyuki Minemura, Yumiko Anzai, Momoyo Enyama, Yoichi Ose, Toshihide Agemura
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AssigneeHitachi High-Tech Corporation
InventorsTakashi Ohshima, Hiroyuki Minemura, Yumiko Anzai, Momoyo Enyama, Yoichi Ose, Toshihide Agemura
Estimating the term…
To provide an electron microscope capable of performing the switching-over between normal illumination and annular illumination, wide-area irradiation, an interference pattern as desired or normal illumination in an expeditious and readily manner or achieving a better S/N ratio, the electron microscope comprises a photocathode 101 with negative electron affinity in use; an excitation optical system to excite the photocathode; and an electron optics system to irradiate an electron beam 13 generated from the photocathode by excitation light 12 irradiated through the excitation optical system onto a sample, the excitation optical system including a light source device 107 for the excitation light; and an optical modulation means 108 which is disposed in an optical path of the excitation light to perform spatial phase modulation to the excitation light.
An electron microscope comprising:
An electron microscope comprising:
An electron microscope comprising:
An electron microscope comprising:
Dependencies are inferred from the claim text.