Electrical test and measurement device, measurement extension device as well as test and measurement system
AssigneeRohde & Schwarz GmbH & Co. KG
InventorPhilip Diegmann
Life of this patent
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Abstract
An electrical test and measurement device is described that has at least one analog channel comprising an analog input, an attenuator circuit, an amplifier unit, and a digitizer. The electrical test and measurement device comprises another digitizer allocated to a digitizer input of the electrical test and measurement device. The digitizer input is configured to be connected to a measurement extension device. Further, a measurement extension device and a test and measurement system are described.
Claims20
An electrical test and measurement device, the electrical test and measurement device comprising:
- at least one analog channel including an analog input, an attenuator circuit, an amplifier unit, and a first digitizer;
- a second digitizer allocated to a digitizer input of the electrical test and measurement device, the digitizer input being configured to be connected to a measurement extension device so that the number of analog channels of the electrical test and measurement device is increased by the measurement extension device to be connected to the electrical test and measurement device;
- wherein the digitizer input is configured to process signals each having several analog signals inputted to the separately formed measurement extension device;
- wherein analog signals received via the digitizer input are directly forwarded to the second digitizer via an input channel such that no amplifying and/or attenuation of the analog signals received via the digitizer input takes place within the electrical test and measurement device.
A measurement extension device for being connected to an electrical test and measurement device, the measurement extension device comprising:
- at least two analog channels each comprising an analog input, an attenuator circuit and an amplifier unit;
- wherein the measurement extension device is capable of being connected to an electrical test and measurement device;
- and
- a common analog output interface with which the analog channels are each connected so that the measurement extension device is configured to increase the number of analog channels of the electrical test and measurement device.
A test and measurement system, the test and measurement system comprising:
- a test and measurement device;
- and
- a measurement extension device comprising:
- at least two analog channels each comprising an analog input, an attenuator circuit and an amplifier unit;
- and
- a common analog output interface with which the analog channels are each connected so that the measurement extension device is configured to increase the number of analog channels of the electrical test and measurement device;
- the test and measurement device comprising:
- at least one analog channel comprising an analog input, an attenuator circuit, an amplifier unit, and a digitizer, and
- a second digitizer allocated to a digitizer input of the test and measurement device, the digitizer input being connected to the measurement extension device so that the number of analog channels of the electrical test and measurement device is increased by the measurement extension device to be connected to the electrical test and measurement device;
- wherein the digitizer input is configured to process signals each having several analog signals inputted to the separately formed measurement extension device;
- wherein the test and measurement device and the measurement extension device are separately formed.
Dependencies are inferred from the claim text.