Appearance inspection system, setting device, image processing device, inspection method, and program
AssigneeOMRON Corporation
InventorYutaka Kato
Life of this patent
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AssigneeOMRON Corporation
InventorYutaka Kato
Estimating the term…
To provide an appearance inspection system capable of reduce labor for setting an imaging condition by a designer when a plurality of inspection target positions on a target is sequentially imaged. An appearance inspection system includes an imaging condition decision part and a route decision part. The imaging condition decision part decides a plurality of imaging condition candidates including a relative position between a workpiece and an imaging device for at least one inspection target position among a plurality of inspection target positions. The route decision part decides a change route of an imaging condition for sequentially imaging the plurality of inspection target positions by selecting one imaging condition among the plurality of imaging condition candidates so that a pre-decided requirement is satisfied.
An appearance inspection system that performs appearance inspection by imaging a target using an imaging device while causing a relative position between the target and the imaging device to be different, the appearance inspection system comprising:
A setting method in an appearance inspection system that performs appearance inspection by imaging a target using an imaging device while causing a relative position between the target and the imaging device to be different, the setting method comprising:
A non-transitory computer readable medium having a program stored thereon, the program supporting an appearance inspection system that performs appearance inspection by imaging a target using an imaging device while causing a relative position between the target and the imaging device to be different, the program causing a computer to perform:
Dependencies are inferred from the claim text.