Optical-electrical device using hybrid automated testing equipment
AssigneeJuniper Networks, Inc.
InventorsChris Barnard, Steven William Keck, Crispin Cruz Mapagay, George R. Sosnowski, Mark Stenholm
Life of this patent
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Abstract
An optical-electrical device can implement a feedback-based control loop for temperature of the device during component calibration. The optical-electrical device can implement compressed air to vary the device temperature during calibration. Additionally, non-active components of the device can be provided current to vary the temperature of the device in concert with the provided compressed air. Additional calibration temperatures can be implemented by activating and deactivating additional non-active components in the device, such as light sources, optical amplifiers, and modulators.
Claims20
A method for calibrating optical components in a photonic integrated circuit (PIC), the method comprising:
- activating one or more active optical components in the PIC of an optical-electrical circuit structure, the optical-electrical circuit structure comprising the PIC and one or more electrical circuits external to the PIC, the one or more electrical circuits including a processor circuit configured to generate a temperature control signal that adjusts an electrically controlled pressured air source that is configured to direct a high pressure airflow towards the PIC;
- generating an initial temperature value using an integrated temperature sensor that is integrated in the optical-electrical circuit structure, the integrated temperature sensor being positioned proximate to the active optical components such that the integrated temperature sensor receives heat generated by the active optical components in the PIC, the initial temperature value indicating that the PIC is at an initial temperature after activation of the one or more active optical components in the PIC, the initial temperature corresponding to a preconfigured calibration temperature utilized to calibrate the PIC;
- receiving calibration adjustments to the one or more active optical components of the PIC while the initial temperature value generated by the integrated temperature sensor indicates the PIC is at the initial temperature;
- detecting, by the processor circuit, varying temperature values generated by the integrated temperature sensor;
- and
- in response to the varying temperature values, adjusting, using the processor circuit, the temperature control signal to cause the electrically controlled pressured air source to vary a strength of the high pressure airflow directed towards the PIC such that a temperature of the PIC is adjusted closer to the initial temperature due to the high pressure airflow passing over the PIC while the one or more active optical components are calibrated.
An optical-electrical structure comprising:
- a photonic integrated circuit (PIC) comprising one or more active optical components that receive current to set the PIC at an initial temperature, the one or more active optical components receiving calibration adjustments while the PIC is set to the initial temperature;
- an integrated temperature sensor that is positioned proximate to the active optical components such that the integrated temperature sensor receives heat generated by the active optical components in the PIC, the integrated temperature sensor to generate an initial temperature value in response to the one or more active optical components receiving current;
- and
- one or more electrical circuits external to the PIC, the one or more electrical circuits including a processor circuit configured to generate a temperature control signal that adjusts an electrically controlled pressured air source that is configured to direct a high pressure airflow towards the PIC, the processor circuit configured to, in response detecting varying temperature values generated by the integrated temperature sensor, adjust the temperature control signal to cause the electrically controlled pressured air source to vary a strength of the high pressure airflow directed towards the PIC such that a temperature of the PIC is adjusted closer to the initial temperature due to the high pressure airflow on the PIC while the one or more active optical components receive calibration adjustments.
Dependencies are inferred from the claim text.