System and method for test and/or calibration of multi-channel RF communication devices

A test system, comprising:

• a test signal generator, comprising:
• a single channel signal source, comprising a processor and a memory, which stores instructions, which when executed by the processor cause the processor to:
• generate a plurality of radio frequency (RF) test signals in parallel with each other, wherein at least one of the RF test signals is orthogonal to the other RF test signals at a given time;
• apply each of the plurality of RF test signals to a corresponding one of a plurality of RF receivers of a device under test (DUT);
• combine a plurality of receive signals each produced from one of the plurality of RF receivers of the DUT in response to the corresponding one of the plurality of RF test signals, to output a combined output signal;
• provide the combined output signal to a test instrument;
• and
• employ the test instrument to independently measure at least one characteristic of each of the plurality of RF receivers from the combined output signal.

A tangible, non-transitory computer readable medium that stores instructions, which when executed by a processor, cause the processor to:

• generate a plurality of radio frequency (RF) test signals in parallel with each other, wherein at least one of the RF test signals is orthogonal to the other RF test signals at a given time;
• apply each of the plurality of RF test signals to a corresponding one of a plurality of RF receivers of a device under test (DUT);
• combine a plurality of receive signals each produced from one of the plurality of RF receivers of the DUT in response to the corresponding one of the plurality of RF test signals, to output a combined output signal;
• and
• provide the combined output signal to a test instrument.