Defect detection for multi-function devices using machine learning
AssigneeXerox Corporation
InventorsEliud Robles Flores, Paul Roberts Conlon, David C. Craig, Lee C. Moore
Life of this patent
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Abstract
A method is disclosed. For example, the method executed by a processor of a multi-function device (MFD) includes executing a defect learning routine to identify defects, cataloging the defects based on a job function, a type of paper, and a machine state, receiving a job request, determining a known defect that has been catalogued based on the job function, the type of paper, and the machine state, and presenting a visualization of the known defect on a display of a user interface before executing the job request.
Claims20
A method, comprising:
- executing, by a processor of a multi-function device, a defect learning routine to identify defects;
- cataloguing, by the processor, the defects based on a job function, a type of paper, and a machine state of the multi-function device;
- receiving, by the processor, a job request;
- determining, by the processor, a known defect that has been catalogued based on the job function, the type of paper, and the machine state;
- and
- presenting, by the processor, a visualization of the known defect on a display of a user interface before executing the job request.
A non-transitory computer-readable medium storing a plurality of instructions, which when executed by a processor of a multi-function device, causes the processor to perform operations comprising:
- executing a defect learning routine to identify defects;
- cataloguing the defects based on a job function, a type of paper, and a machine state of the multi-function device;
- receiving a job request;
- determining a known defect that has been catalogued based on the job function, the type of paper, and the machine state;
- and
- presenting a visualization of the known defect on a display of a user interface before executing the job request.
A method, comprising:
- executing, by a processor of a multi-function device, a diagnostic routine and a maintenance routine to identify defects;
- cataloguing, by the processor, the defects based on a job function, a type of paper, and a machine state of the multi-function device;
- receiving, by the processor, a job request;
- determining, by the processor, a known defect that has been catalogued based on the job function, the type of paper, and the machine state;
- and
- presenting, by the processor, a visualization of the known defect on a display of a user interface before executing the job request, wherein the visualization illustrates the known defect and presents an option for a user to ignore the known defect and continue with execution of the job request.
Dependencies are inferred from the claim text.