Display module with improved electrical test and manufacturing method of the display module
AssigneeSamsung Electronics Co., Ltd.
InventorsYoungki Jung, Jinho Kim, Sangmin Shin, Changjoon Lee
Life of this patent
Estimating the term…
Abstract
A display module including a glass substrate; a thin film transistor layer disposed in a first area of the glass substrate; a plurality of connection pads disposed in a second area extending from the first area of the glass substrate and electrically connected to the thin film transistor layer; a plurality of test pads disposed in a third area extending from the second area of the glass substrate and electrically connected to the plurality of connection pads, respectively, and a plurality of connection wirings electrically connecting the plurality of connection pads and the plurality of test pads.
Claims13
A display module comprising:
- a glass substrate;
- a thin film transistor layer disposed on a first area of the glass substrate;
- a plurality of connection pads disposed in a second area of the glass substrate extending from the first area of the glass substrate and electrically connected to the thin film transistor layer;
- a plurality of test pads disposed in a third area of the glass substrate extending from the second area of the glass substrate and electrically connected to the plurality of connection pads, respectively;
- and
- a plurality of connection wirings electrically connecting the plurality of connection pads and the plurality of test pads.
A display module comprising:
- a glass substrate;
- a thin film transistor layer formed on a first surface of the glass substrate;
- a plurality of light emitting diodes (LEDs) mounted on the thin film transistor layer;
- a plurality of connection pads formed on the first surface of the glass substrate;
- a plurality of driving pads formed on a second surface of the glass substrate;
- a plurality of side wirings configured to electrically connect the plurality of connection pads and the plurality of driving pads corresponding to each of the plurality of connection pads;
- and
- a plurality of connection wirings configured to connect a plurality of connection pads and a plurality of test pads in a dummy area extending to an edge area of the glass substrate,
- wherein the plurality of test pads and a portion of each of the plurality of connection wirings corresponding to the plurality of test pads are removed after a substrate test is performed.
Dependencies are inferred from the claim text.