Designer atomic layer etching
AssigneeLam Research Corporation
InventorKeren Jacobs Kanarik
Life of this patent
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Abstract
Methods for evaluating synergy of modification and removal operations for a wide variety of materials to determine process conditions for self-limiting etching by atomic layer etching are provided herein. Methods include determining the surface binding energy of the material, selecting a modification gas for the material where process conditions for modifying a surface of the material generate energy less than the modification energy and greater than the desorption energy, selecting a removal gas where process conditions for removing the modified surface generate energy greater than the desorption energy to remove the modified surface but less than the surface binding energy of the material to prevent sputtering, and calculating synergy to maximize the process window for atomic layer etching.
Claims11
A method of etching a material on a substrate, the method comprising:
- identifying process conditions for an atomic layer etching process of the material using a modification gas and a removal gas;
- and
- performing the atomic layer etching process on the material on the substrate by:
- exposing the substrate to the modification gas to modify a surface of the material, the modification gas having a modification energy and a desorption energy with respect to the material to be etched, and
- exposing the modified surface to the removal gas and igniting a plasma to remove the modified surface,
- wherein the modification energy is less than the desorption energy, and the desorption energy is less than a surface binding energy of the material;
- wherein the identifying the process conditions comprises selecting a substrate temperature for performing the exposing the substrate to the modification gas, wherein an ion energy provided by the substrate temperature is between the modification energy and the desorption energy;
- wherein the material has a surface binding energy greater than about 6 eV;
- and
- further comprising setting the substrate at a temperature to provide an ion energy between the modification energy and the desorption energy prior to performing the atomic layer etching process.
Dependencies are inferred from the claim text.